Discover more about our solutions for USB 3.1 Type-C, USB 3.1, and USB 2.0 based systems.
USB
Die USB-TX- und USB-RX-Softwarelösungen von Tektronix entsprechen den Anforderungen an die elektrische Prüfung, Konformität, Charakterisierung und Fehlerbehebung, die von Ingenieuren gestellt werden, die an der Entwicklung von auf USB 3.1 Typ C, USB 3.1 und USB 2.0 basierenden Systemen arbeiten, und erfüllen die USB-IF-Prüfstandards. Eine Lösung für elektrisch-parametrische Messungen auf USB-PD-Basis und Protokollmessungen zur Konformitätsprüfung ist ebenfalls erhältlich.
NEU! Automatische Messlösung basierend auf USB 3.1 Typ C
- Ermitteln Sie mit der Kombination aus voller SigTest-Unterstützung und DPOJET im Handumdrehen die Ursache von Problemen beim Testen von Designs vom Typ C auf Basis von SuperSpeed USB 3.1. Datenblatt USB 3.1-Software »
Sender- und Empfängertests mit Oszilloskopen und BERTs von Tektronix
- NEU! BERTScope-Geräte der BSX-Serie unterstützen Gen1 mit 5 Gbit/s sowie Gen2 mit 10 Gbit/s und bieten einen integrierten DPP sowie eine protokollsensitive Architektur.
- Oszilloskope der Serien MSO/DPO70000 DX erlauben Protokollanalysen sowie elektrische Prüfungen mit seriellen Bitmustertriggern.
- Oszilloskope der DPO70000SX-Serie bieten das branchenweit niedrigste Rauschen, für genaueste Charakterisierung und Grenzwertanalyse.
Ausgewählte Inhalte
USB 3.1 What you need to know - Reference Guide
Quickly and easily reference important USB specifications without having to comb through hundreds of pages. This guide includes important Electrical Test Parameters, reference pictures for Compliance Patterns, Loopback sequences for both Gen 1 and Gen 2, how to overcome key Tx and Rx test and measurement challenges, and more.
USB 3.1 Receiver Compliance Testing (Konformitätsprüfungen bei USB 3.1-Empfängern)
In diesem Anwendungshinweis werden alle Aspekte von USB 3.1-Empfängertests beschrieben, darunter, Augenkalibrierung und Jitter-Toleranztests unter Last mit gemessenen Gerätegrenzwerten.
Simplify your USB Type-C Design Validation - From Complexity to Confidence. (Vereinfachen Sie die Validierung Ihres USB Type C-Designs - Zuverlässigkeit statt Komplexität)
Umfassende Werkzeuge für die Fehlerbereinigung sind unerlässlich, wenn Sie sich darauf verlassen wollen, dass Ihr Produkt Konformitätstests besteht und zertifiziert wird. Dieses ausführliche Webinar hilft Ihnen, Ihre Validierungsaufgaben zu vereinfachen - für mehr Zuverlässigkeit statt Komplexität.
Bibliothek
| Title |
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| Understanding and Performing USB 2.0 Physical Layer Testing This application note provided an overview of USB 2.0 physical layer testing including signal quality, in-rush current check, drop and droop tests. It describes tests for high-speed mode, and information on using protocol analysis for debugging. |
| USB 3.1 What you need to know - Reference Guide Quickly and easily reference important USB specifications without having to comb through hundreds of pages. This guide includes important Electrical Test Parameters, reference pictures for Compliance Patterns, Loopback sequences for both Gen 1 and Gen 2, how to overcome key Tx and Rx test and measurement challenges, and more. |
| The Basics of Serial Data Compliance and Validation Measurements This primer is designed to help you understand the common aspects of serial data transmission & to explain the analog and digital measurement requirements that apply to these emerging serial technologies |
| USB 3.1 Receiver Compliance Testing All aspects of USB 3.1 receiver testing are covered, including stressed eye calibration and jitter tolerance testing with measured device margin. |
| Troubleshooting USB 2.0 Problems with Your Oscilloscope Learn the basics of the USB 2.0 physical layer to troubleshoot bus problems or system issues. Learn how to set up and interpret the results when using automated decoding, triggering, and search on an oscilloscope equipped with USB 2.0 bus analysis capability. |
| Advanced Serdes Debug with a BERT Learn simple strategies to pinpoint bit errors to the exact bit position and timing with powerful Error Location Analysis and a BERT. |
| High Speed Interface Standards This e-Guide will help you learn more about design challenges for testing PCIe 4.0, SAS, SuperSpeed USB, and DDR4 standards. Within the pages of the eGuide you will also get quick access to technical resources that will help you understand design challenges and pick the right solution for your test needs. |
| Application Kit for USB 3.1 Transmitter and Receiver Testing |
| USB 2.0 Compliance SolutionThis fact sheet details the recommended equipment to meet the USB 2.0 compliance testing requirements. |
| Debugging Serial Buses in Embedded System Designs Find out how the protocol trigger, decode and search capabilities of the popular MSO and DPO Series oscilloscopes solve serial bus integration and debug challenges of many buses such as I2C, SPI , USB, RS-232/422/485/UART, CAN, LIN, FlexRay, Ethernet, and I2S/LJ/RJ/TDM. |
| Titel | |
|---|---|
| Simplify your USB Type-C Design Validation - From Complexity to Confidence. | Comprehensive tools for debugging failures are key to building confidence that your product will pass compliance and achieve certification. This in-depth webinar will help simplify your validation tasks, moving from complexity to confidence. |
| Electrical Validation of the Type-C Interface | The introduction of the Type-C interface, and its implementation across multiple high-demand serial standards, has created new challenges for developers. This webinar explores the latest updates to the Type-C specification, as they pertain to USB3.1, DisplayPort, and Thunderbolt standards, including Power Delivery. |
| Testing USB 3.1 | View this short webinar to learn more about this new standard and how to prepare for compliance tests. |
| Title | |
|---|---|
| USB 2.0 Hub MOI | High-Speed Electrical Testing - Hub MOI |
| USB 2.0 Host MOI | High-Speed Electrical Testing - Host MOI |
| Tektronix USB2.0 Device MOI | USB 2.0 Universal Serial Bus Measurement MOI |
| Tektronix High-Speed Electrical Testing - Host MOI | High-Speed Electrical Testing - Host MOI |
| High-Speed Electrical Testing - Hub MOI | High-Speed Electrical Testing - Hub MOI |
| USB 3.1 Receiver Testing MOI | This MOI reviews the methods used for USB 3.1 (10 Gb/s) receiver compliance testing using the BERTScope Bit Error Rate Testers. |
| USB 2.0 Test Procedures MOI | USB 2.0 Test Procedures Method of Implementation |
| USB 3.1 Cable Tests MOI | This MOI specifies the testing procedures for the SuperSpeed channels of a USB 3.1 cable and mated cable assembly including Type-C to Type-C and Type-C to legacy connectors. |
| USB 3.0 Cable Tests MOI | This MOI specifies the testing procedures for the Super Speed channels of a USB 3.0 cable and mated cable assembly.. |
| USB 3.0 Receiver Testing MOI | This MOI reviews the methods used for USB 3.0 receiver compliance testing using the BERTScope Bit Error Rate Testers. |