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Die USB-TX- und USB-RX-Softwarelösungen von Tektronix entsprechen den Anforderungen an die elektrische Prüfung, Konformität, Charakterisierung und Fehlerbehebung, die von Ingenieuren gestellt werden, die an der Entwicklung von auf USB 3.1 Typ C, USB 3.1 und USB 2.0 basierenden Systemen arbeiten, und erfüllen die USB-IF-Prüfstandards. Eine Lösung für elektrisch-parametrische Messungen auf USB-PD-Basis und Protokollmessungen zur Konformitätsprüfung ist ebenfalls erhältlich.

Automatische Messlösung basierend auf USB 3.1 Typ C

  • Ermitteln Sie mit der Kombination aus voller SigTest-Unterstützung und DPOJET im Handumdrehen die Ursache von Problemen beim Testen von Designs vom Typ C auf Basis von SuperSpeed USB 3.1. Datenblatt USB 3.1-Software »

Sender- und Empfängertests mit Oszilloskopen und BERTs von Tektronix 

Erfahren Sie mehr über unsere Lösungen für auf USB 3.1 Typ C, USB 3.2 und USB 2.0 basierte Systeme.

Bibliothek

Title
The Basics of Serial Data Compliance and Validation Measurements
High-speed serial bus architectures are the new norm in today’s high-performance designs. While parallel bus standards are undergoing some changes, serial buses are established across multiple markets …
USB 3.0 Physical Layer Measurements
High Speed Interface Standards
This e-Guide will help you learn more about design challenges for testing PCIe 4.0, SAS, SuperSpeed USB, and DDR4 standards. Within the pages of the eGuide you will also get quick access to technical …
Advanced Serdes Debug with a BERT
Learn simple strategies to pinpoint bit errors to the exact bit position and timing with powerful Error Location Analysis and a BERT.
USB 2.0 Compliance Solution
This fact sheet details the recommended equipment to meet the USB 2.0 compliance testing requirements.
Simplifying Validation and Debug of USB 3.1 Designs
This application note will explain the evolution of the Universal Serial Bus (USB) standard and testing approaches that have been developed to accommodate the increasing speed and complexity of this …
Troubleshooting USB 2.0 Problems with Your Oscilloscope
Learn the basics of the USB 2.0 physical layer to help you troubleshoot bus problems or system issues.  Learn how to set up and interpret the results when using automated decoding, triggering, and …
Application Kit for USB 3.1 Transmitter and Receiver Testing
This kit contains the following application notes:   USB 3.1 Receiver Compliance Testing covers all aspects of USB 3.1 receiver testing, including stressed eye calibration and jitter tolerance …
USB 3.1 What you need to know - Reference Guide
Quickly and easily reference important USB specifications without having to comb through hundreds of pages. This guide includes important Electrical Test Parameters, reference pictures for Compliance …
USB 3.1 Receiver Compliance Testing
In this application note, all aspects of USB 3.1 receiver testing are covered, including stressed eye calibration and jitter tolerance testing with measured device margin.    
Debugging Serial Buses in Embedded System Designs
Find out how the protocol trigger, decode and search capabilities of the popular MSO and DPO Series oscilloscopes solve serial bus integration and debug challenges of many buses such as I2C, SPI , USB …
How to Debug USB 3.1 Gen1 and Gen2 Electrical Compliance Failures
Learn more about the Type-C connector and the benefits it brings to USB 3.1, the latest USB 3.1 specifications, and how you can go beyond compliance testing to get to the bottom of issues that east …
Understanding and Performing USB 2.0 Physical Layer Testing
This application note gives an overview of USB 2.0 physical layer testing includingEletrical tests such as signal quality, in-rush current check, drop and droop testsSpecific information on testing …
Title
Testing USB 31
With computer peripheral devices demanding more bandwidth; the industry is making its move to faster serial I/O. USB3.1 brings a staggering 10Gb/sec to computing peripherals. View this short webinar …
Simplify your USB TypeC Design Validation From Complexity to Confidence
Comprehensive tools for debugging failures are key to building confidence that your product will pass compliance and achieve certification. This in-depth webinar will help simplify your validation …
Electrical Validation of the Type-C Interface
The introduction of the Type-C interface, and its implementation across multiple high-demand serial standards, has created new challenges for developers. These include new compliance channel …
Title
USB 2.0 Hub MOI
High-Speed Electrical Testing - Hub MOI 
USB 2.0 Test Procedures MOI
USB 2.0 Test Procedures Method of Implementation
USB 3.0 Receiver Testing MOI
This MOI reviews the methods used for USB 3.0 receiver compliance testing using the BERTScope Bit Error Rate Testers.
USB 3.1 Cable Tests MOI
This MOI specifies the testing procedures for the SuperSpeed channels of a USB 3.1 cable and mated cable assembly including Type-C to Type-C and Type-C to legacy connectors.
USB 3.0 Cable Tests MOI
This MOI specifies the testing procedures for the Super Speed channels of a USB 3.0 cable and mated cable assembly.
USB3 DPOJET MOI
This MOI specifies the testing procedures for USB 3.0 Transmitter Tests using Tektronix DPOJET and Tektronix Oscilloscopes.
USB 2.0 Host MOI
High-Speed Electrical Testing - Host MOI 
USB 3.1 Receiver Testing MOI
This MOI reviews the methods used for USB 3.1 (10 Gb/s) receiver compliance testing using the BERTScope Bit Error Rate Testers.
High-Speed Electrical Testing - Hub MOI
High-Speed Electrical Testing - Hub MOI
Tektronix USB2.0 Device MOI
USB 2.0 Universal Serial Bus Measurement MOI
Tektronix High-Speed Electrical Testing - Host MOI
High-Speed Electrical Testing - Host MOI