Suchen

Filtern nach Type

Produkte (1)
Technisches Dokument (15)
- Anwendungshinweis (9)
- Produkt-Auswahlhilfe (2)
- Broschüre (1)
- Einführungshandbuch (1)
- Technisches Informationsblatt (1)
- White Paper (1)
Blogeintrag (1)
Solutions (1)

Product Support Center

Find the latest firmware, software, drivers, manuals, brochures. specifications and technical literature.

Learning Center

Learn how to use our equipment to troubleshoot system anomalies, provide measurement insights, debug EMI, and more.

TekTalk Community Forum

Ask questions, explore products and solutions and discuss with other TekTalk members, including Tektronix engineers.

Suchergebnisse

1 - 10 aus 18

Sortieren nach

Products
SMU-Serie 2606B

VCSEL, Laserdioden-Produktionstest LED-Produktionstest Transistorcharakterisierung

Compare models. Request a quote.
Letzte Aktualisierung Wednesday, April 26, 2023
Technical Document
Source Measure Unit (SMU) Instruments Selector Guide

MAKE MULTIPLE MEASUREMENTS ACCURATELY USING A SINGLE INSTRUMENT A source measure unit (SMU) instrument is a five-in-one tool. It combines the useful features of a digital multimeter (DMM), power supply, current …

1KW-61458-2 | Date: Tuesday, August 24 2021
Technical Document
Wafer Level Reliability Testing with the Keithley Model 4200A-SCS Parameter Analyzer

Introduction The continuing push for more devices on each chip and faster clock speeds is driving the demand for shrinking geometries, new materials, and novel technologies. All of these factors have a tremendous impact on the lifetime and …

1KW-61526-0 | Date: Monday, January 28 2019
Technical Document
Keithley Instrumentation for Electrochemical Test Methods and Applications

This application note discusses a variety of electrochemical applications, including voltammetry, low and high resistivity measurements, battery test, potentiometry, electrodeposition, electrical device characterization, and other tests that involve sourcing and measuring current and voltage and measuring capacitance with high accuracy.

1KW-60158-1 | Date: Wednesday, April 25 2018
Technical Document
New High Power Semiconductor Devices are Pushing Instrumentation to Extremes

Design and production of today’s semiconductors and power modules based on silicon carbide and gallium nitride demand more rigorous testing than with previous generations. This technical brief provides information on how to cost-effectively achieve safe, accurate, and reliable testing to meet precise design requirements.

1KW-73841-0 | Date: Wednesday, October 13 2021
Technical Document
Source Measure Units - Save Time, Space and Money and Make Multiple Measurements Accurately Using a Single Instrument

Learn how the integrated five-in-one functionality of just one source measure unit (SMU) instrument eliminates many of the issues associated with using multiple instruments, including workspace clutter, measurement insight delays and much higher costs. See how using a SMU can save you space, time - and even money.

1KW-61419-0 | Date: Monday, July 09 2018
Technical Document
Four-Probe Resistivity and Hall Voltage Measurements with the Model 4200-SCS

Introduction Semiconductor material research and device testing often involve determining the resistivity and Hall mobility of a sample. The resistivity of semiconductor material is primarily dependent on the bulk doping. In a …

Rev 7.15.11 ah | Date: Friday, February 03 2012
Technical Document
Keithley Cables Selector Guide

TERMINATIONS LENGTH Model Description Type From To m …

1KW-73964-1 | Date: Monday, May 15 2023
Technical Document
C-V Testing for Semiconductor Components and Devices - Applications Guide

This C-V testing applications e-guide features a concentration of application notes on C-V testing methods and techniques using Keithley’s Model 4200-SCS Parameter Analyzer.

Date: Friday, January 17 2014
Solutions
ATE-Systeme

Letzte AktualisierungTuesday, October 18, 2022