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Datenblatt Literaturnummer Veröffentlichungsdatum 4200A-SCS Parameter Analyzer Datasheet
1KW-60780-6 Probe Station Mounting Base Installation Instructions
This document provides instructions for installing the Keithley Model 4200-PA Remote Preamplifier and Model 4225-RPM Remote Pulse Measure Unit onto the Model 4200-MAG-BASE and Model 4200-VAC-BASE.PA-624 Model 4200-RM Rack Mount Kit Packing List
Model 4200-RM Rack Mount Kit Packing List PA-709PA-709
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Technische Dokumente Dokumenttyp Veröffentlichungsdatum TECHNIQUES FOR MEASURING RESISTIVITY FOR MATERIALS CHARACTERIZATION
Anwendungshinweis Making Three-Terminal Capacitance-Voltage Measurements Up to 400 V Using the 4200A-CVIV Multi-Switch Bias Tee Capability
This application note explains how the CISS, COSS and CRSS measurements are made using the bias tee capabilities in the 4200A-CVIV Multi-Switch. This application note also shows how the instrument DC output voltage was doubled from 200 V to 400 V for …Anwendungshinweis Pulse I-V Characterization of Non-Volatile Memory Technologies
This application note provides a brief history of non-volatile memory (NVM), an overview of the test parameters required for electrical characterization of NVM materials and devices, and a discussion of emerging test requirements. It also provides …Anwendungshinweis Using USB Communication to Control External Instruments with the 4200A-SCS Parameter Analyzer
The 4200A-SCS Parameter Analyzer with Clarius+ V1.9 software can control instruments through USB communication. The Clarius software includes user libraries to control a generic USB instrument and one that controls the Keithley DMM6500 and DMM7510 …Anwendungshinweis Using the 4200A-SCS Parameter Analyzer Built-in FFT Functions
The 4200A-SCS Parameter Analyzer with Clarius+ V1.9 software includes FFT analysis functions that enable the user to automatically make frequency-based calculations on time domain measurements without having to download the data and perform analysis …Anwendungshinweis DC I-V Characterization of FET-Based Biosensors Using the 4200A-SCS Parameter Analyzer
Research and development of FET-based biosensors have increased because of their low cost, rapid response, and accurate detection. A bioFET converts a biological response to an analyte into an electrical signal that can easily by measured by DC I-V …Anwendungshinweis Making Femtofarad (1e-15F) Capacitance Measurements with the 4215-CVU
This application note explains how to make femtofarad capacitance measurements using the 4215-CVU Capacitance Voltage Unit. This includes making proper connections and using the proper test settings in the Clarius software for the best results.Anwendungshinweis Evolving Materials and Testing for Emerging Generations of Power Electronics Design
Transitioning from silicon to wide bandgap semiconductors such as silicon carbide and gallium nitride means that power module designs can be physically smaller than what came before, while also increasing MOSFET switching speed and energy efficiency …Technisches Informationsblatt Electrical Characterization of Carbon Nanotube Transistors (CNT FETs) with the 4200A-SCS Parameter Analyzer
Anwendungshinweis Electrical Characterization of Photovoltaic Materials and Solar Cells with the 4200A-SCS Parameter Analyzer
Anwendungshinweis 1 ns Pulsing Solutions for Non-Volatile Memory Testing
Ultra-fast (<10 ns) pulsing is required to develop the newest non-volatile memory types like Flash, PCRAM, STT-RAM and others. In addition to the recommended minimum and allowable minimum pulse widths possible using the Keithley 4225-PMU Ultra-Fast I …Technisches Informationsblatt An Ultra-Fast Single Pulse (UFSP) Technique for Channel Effective Mobility Measurement
Anwendungshinweis Upgrade Your 4200-SCS System and Protect Your Investment
Upgrade your 4200-SCS Parameter Analyzer to the 4200A-SCS - the industry's highest performance analyzer - and accelerate I-V, C-V, and ultra-fast pulsed I-V testing of your complex devices for materials research, semiconductor device design, process …Datenblatt Using the Ramp Rate Method for Making Quasistatic C-V Measurements with the 4200A-SCS Parameter Analyzer
Anwendungshinweis Using the Model 4225-RPM Remote Amplifier/ Switch to Automate Switching Between DC I-V, C-V, and Pulsed I-V Measurements
Anwendungshinweis Using the 4200-CVU-PWR C-V Power Package to Make High Voltage and High Current C-V Measurements with the 4200A-SCS Parameter Analyzer
Anwendungshinweis METHODS AND TECHNIQUES FOR SEMICONDUCTOR CHARACTERIZATION
Anwendungshinweis Simplifying MOSFET and MOSCAP Device Characterization e-Guide
This e-guide answers some common questions about making better semiconductor measurements, with a focus on DC I-V and capacitance-voltage (C-V) measurements. It also touches on more specific applications and how you can simplify making the …Broschüre C-V Characterization of MOS Capacitors Using the Model 4200-SCS Semiconductor Characterization System
Anwendungshinweis C‑V Characterization of MOS Capacitors Using the 4200A-SCS Parameter Analyzer
Anwendungshinweis Resistivity Measurements of Semiconductor Materials Using the 4200A-SCS Parameter Analyzer and a Four-Point Collinear Probe
Anwendungshinweis Measuring MOSFET Gate Charge with the 4200A-SCS Parameter Analyzer
This application note describes how to measure gate charge on a MOSFET based on the JEDEC Gate Charge Test Method using the 4200A-SCS Parameter Analyzer.Anwendungshinweis Wafer Level Reliability Testing with the Keithley Model 4200A-SCS Parameter Analyzer
Evolving design scales and new materials are making wafer level reliability testing more critical than ever. This is also driving the demand for reliability testing and modeling much further upstream, especially into the R&D process …Anwendungshinweis Greater Reliability Testing Confidence from Lab to Fab - Wafer Level Reliability Test Solutions
Keithley Instruments has long been an industry leader in both overall parametric test technology and wafer level reliability (WLR) testing. Several generations of Keithley’s parametric test solutions have offered WLR test algorithm libraries as …Poster Keithley Instrumentation for Electrochemical Test Methods and Applications
This application note discusses a variety of electrochemical applications, including voltammetry, low and high resistivity measurements, battery test, potentiometry, electrodeposition, electrical device characterization, and other tests that involve …Anwendungshinweis Making van der Pauw Resistivity and Hall Voltage Measurements Using the 4200A-SCS Parameter Analyzer
This application note provides an overview of the van der Pauw and Hall effect measurement methods and how to use the built-in applications that are included with the 4200A-SCS Parameter Analyzer to perform these measurements.Anwendungshinweis DC I-V Testing for Components and Semiconductor Devices
DC I-V measurements are the cornerstone of device and material testing. This DC I-V testing applications e-guide features a concentration of application notes on DC I-V testing methods and techniques using Keithley’s Model 4200-SCS Parameter Analyzer …Anwendungshinweis DC I-V and AC Impedance Testing of Organic FETs
This application note outlines how to optimize DC I-V and AC impedance measurements on OFETs using the 4200A-SCS Parameter Analyzer. Timing parameters, noise reduction, shielding, proper cabling, and other important measurement considerations for …Anwendungshinweis Performing Charge Pumping Measurements with the 4200A-SCS Parameter Analyzer
This application note explains how to make charge pumping measurements using the 4200A-SCS with the optional 4225-PMU Ultra-Fast I-V Module (PMU) or 4220-PGU Pulse Generator Unit (PGU).Anwendungshinweis Performing Very Low Frequency Capacitance-Voltage Measurements on High Impedance Devices Using the 4200A-SCS Parameter Analyzer
Anwendungshinweis TECHNIQUES FOR MEASURING RESISTIVITY FOR MATERIALS CHARACTERIZATION
Anwendungshinweis Making Stable Low Current Measurements with High Test Connection Capacitance Using the 4201-SMU and 4211-SMU
This application note explains the maximum capacitance specifications of an SMU, and describes several applications on which the 4201-SMU and 4211-SMU enables you to make stable low current measurements. The example applications describe include the …Anwendungshinweis Making Optimal Capacitance and AC Impedance Measurements with the 4200A-SCS Parameter Analyzer
Capacitance-voltage (C-V) and AC impedance measurements are commonly performed on many types of devices for a wide variety of applications. This application note describes how to make optimal capacitance measurements using proper measurement …Anwendungshinweis Making Low Current Pulse I-V Measurements
This application note defines ultra-fast I-V, explains the fundamental limits of current measurements as a function of time and measure window, and describes the techniques for making ultra-fast I-V low current measurements.Anwendungshinweis Touch, Test, Invent with the Next Generation Current and Voltage Source-Measure Instruments
Datenblatt Using the Model 4200-CVU-PWR C-V Power Package to Make High Voltage and High Current C-V Measurements with the Model 4200-SCS Semiconductor Characterization System
Anwendungshinweis Probing Transistors at the Contact Level in Integrated Circuits
Anwendungshinweis Pulse Testing for Nanoscale Devices
Technischer Artikel Optimizing Low Current Measurements with the Model 4200-SCS Semiconductor Characterization System
Anwendungshinweis Pulsed I-V Testing for Components and Semiconductor Devices - Applications Guide
Anwendungshinweis Safely Using the Interlock on the Keithley Model 4200-SCS
Anwendungshinweis Performing Charge Pumping Measurements with the Model 4200-SCS Semiconductor Characterization System
Anwendungshinweis Electrical Characterization of Photovoltaic Materials and Solar Cells with the Model 4200-SCS Semiconductor Characterization System
Anwendungshinweis ACS Integrated Test System for Lab-Based Automation
Anwendungshinweis Breathe New Life into Your 4200-SCS Parameter Analyzer
Datenblatt Advances in Electrical Measurements for Nanotechnology E-Handbook
Rev 3.13Datenblatt SOLUTIONS FOR SCIENTIFIC AND ENGINEERING RESEARCH
Broschüre KTEI V8.2 for the Model 4200-SCS: Characterize NVM, Measure VLF C-V, Make More Pulsed or Ultra-fast I-V Measurements in Parallel
Broschüre Integral PC Design of Keithley Model 4200-SCS is at the Leading Edge of a New Instrumentation Trend
Technischer Artikel A Local Area Network Laboratory Based on the Keithley 4200-SCS for Engineering Education in Microelectronics
White Paper I-V Measurements of Nanoscale Wires and Tubes with the Model 4200-SCS and Zyvex S100 Nanomanipulator
Anwendungshinweis Making Charge-Pumping Measurements with the Model 4200-SCS Semiconductor Characterization System and Series 3400 Pulse/Pattern Generator
Anwendungshinweis Making I-V and C-V Measurements on Solar/Photovoltaic Cells Using the Model 4200-SCS Semiconductor Characterization System
Anwendungshinweis Making Ultra-Low Current Measurements with the Low-Noise Model 4200-SCS
Making Ultra-Low Current Measurements with the Low-Noise Model 4200-SCS Semiconductor Characteriztion System Parametric characterization of semiconductor devices typically requires making extremely low current measurements. For MOSFET devices, the …Anwendungshinweis Measuring Inductance Using the 4200-CVU Capacitance-Voltage Unit
Anwendungshinweis Ultra-Fast I-V Applications for the Model 4225-PMU Ultra-Fast I-V Module
Anwendungshinweis Ultra Fast Single Pulse Technique for Channel Effective Mobility Measurement
Anwendungshinweis Using the 4200A-CVIV Multi-Switch to Make High Voltage and High Current C-V Measurements
This application note explains the implementation of the bias tee modes of the 4200A-CVIV to make high voltage C-V measurement. It assumes the reader is familiar with making C-V measurements with the Keithley 4200A-SCS using the CVIV.Anwendungshinweis Using the Ramp Rate Method for Making Quasistatic C-V Measurements with the Model 4200-SCS Semiconductor Characterization System
Anwendungshinweis Using the Wafer Map Parameters Option with Cascade Nucleus Prober Software and the Model 4200-SCS
Anwendungshinweis Model 4200-SCS & KTEI 5.0 Software Extend Semi Characterization to Stress-Measure, Reliability Test
Cleveland, Ohio - December 11, 2003 - Keithley Instruments, Inc. (NYSE: KEI) today announced availability of its Model 4200-SCS Semiconductor Characterization System with its integral Keithley Test Environment-Interactive (KTEI) v5.0 software.Pressemitteilungen Model 4200-SCS Semiconductor Characterization System
Full color brochure covering the semiconductor characterization system, Model 4200-scs.Broschüre Automating High and Low Frequency C-V Measurements and Interface Trap Density (DIT) Calculations of MOS Capacitors Using the 4200A-SCS Parameter Analyzer
This application note discusses how to use the 4200A-SCS Parameter Analyzer to measure and to automatically switch between high and low frequency C-V measurements on MOS capacitors. Basic information on MOS capacitors and common parameter extractions …Anwendungshinweis Modifying Keithley Interlock Cable 236-ILC-3 for Use w/Cascade 12000 Series Semiautomatic Probers
Anwendungshinweis Monitoring Channel Hot Carrier (CHC) Degradation of MOSFET Devices using Keithley's Model 4200-SCS
Anwendungshinweis Moving from Windows XP to Windows 7? Upgrade Your Model 4200-SCS
Schritt-für-Schritt-Anleitung Optimizing Low Current Measurements with the 4200A-SCS Parameter Analyzer
Introduction Many critical applications demand the ability to measure very low currents such as picoamps or less. These applications include determining the gate leakage current of FETs, testing sensitive nano-electronic …Anwendungshinweis Switching Between C-V and I-V Measurements Using the 4200A-CVIV Multi-Switch and 4200A-SCS Parameter Analyzer
Introduction Full parametric characterization of a semiconductor device usually requires an array of tests to gather all of the device's important parameters. Current-voltage (I-V) tests are used to determine device …Anwendungshinweis Discover Today's Solutions for Tomorrow's Nano Characterization Challenges
Broschüre Four-Probe Resistivity and Hall Voltage Measurements with the Model 4200-SCS
Anwendungshinweis Gate Dielectric Capacitance-Voltage Characterization Using the Model 4200
Introduction Maintaining the quality and reliability of gate oxides is one of the most critical and challenging tasks in any semiconductor fab. With feature sizes shrinking to 0.18µm or less, gate oxides are often less than 30Å …Anwendungshinweis Creating External Instruments Drivers for the Model 4200-SCS
Anwendungshinweis E-Handbook Guide to Switch Considerations by Signal Type
Datenblatt Electrical Characterization of Carbon Nanotube Transistors (CNT FETs) with the Model 4200-SCS Semiconductor Characterization System
Anwendungshinweis How to Choose and Apply Source Measure Unit SMU Instruments
Anwendungshinweis The Emerging Challenges of Nanotechnology Testing
Nanotechnology is an important new area of research that promises significant advances in electronics, materials, biotechnology, alternative energy sources, and dozens of other applications. …Technischer Artikel Evaluating Hot Carrier Induced Degradation of MOSFET Devices
Application Note # 2197 Evaluating Hot Carrier Induced Degradation of MOSFET Devices With decreased MOSFET gate length, hot carrier induced degradation has become one of the most important reliability concerns.Anwendungshinweis Evaluating Oxide Reliability
Application Note Number 2240 Evaluating Oxide Reliability Using V-Ramp and J-Ramp Techniques Oxide integrity is an important reliability concern, especially for today's ULSI MOSFET devices, where oxide thickness has been scaled to a few atomic layers …Anwendungshinweis C-V Testing for Semiconductor Components and Devices - Applications Guide
Anwendungshinweis DC Electrical Characterization of RF Power Transistors
Anwendungshinweis Improving the Measurement Speed and Overall Test Time of the Model 4200-SCS
Anwendungshinweis Writing Prober Drivers for the Model 4200-SCS
Anwendungshinweis Performing Very Low Frequency Capacitance-Voltage Measurements on High Impedance Devices Using the Mode 4200-SCS Semiconductor Characterization System
Anwendungshinweis
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Software Dokumenttyp Teilenummer Veröffentlichungsdatum 4200A-SCS Clarius+ Software Suite V1.9.1
This version of Clarius+ is only supported on Microsoft Windows 10. If installed on the 4200A-SCS system with a Clarius+ release prior to V1.4, contact Keithley, a Tektronix Company, at TEK.com to upgrade the parameter analyzer. If installing on a …Anwendungsgebiet 4200A-CLARIUS-V1.9.1 4200A-SCS Clarius+ Software Suite V1.9
This version of Clarius+ is only supported on Microsoft Windows 10. If installed on the 4200A-SCS system with a Clarius+ release prior to V1.4, contact Keithley, a Tektronix Company, at TEK.com to upgrade the parameter analyzer. If installing on a …Anwendungsgebiet 4200A-CLARIUS-V1.9 Hot Fix Package for 4200A-SCS Clarius V1.8.1
This download is not a complete Clarius+ software installation. It only contains the files necessary to address important issues found with KXCI SMU control in Clarius+ V1.8.1. Please read the release notes for the installation instructions and …Anwendungsgebiet CLARIUS_V1.8.1HF1 4200A-SCS Clarius+ Software Suite V1.8.1
This version of Clarius+ is only supported on Microsoft Windows 10. If installed on the 4200A-SCS system with a Clarius+ release prior to V1.4, contact Keithley, a Tektronix Company, at TEK.com to upgrade the parameter analyzer. If installing on a …Anwendungsgebiet 4200A-CLARIUS-V1.8.1 4200A-SCS Clarius+ Software Suite V1.3 (Legacy – Unsupported)
This legacy version of Clarius is made available for Windows 7 computers. For the latest version of Clarius+ please visit the 4200A-SCS Product Support page ( Product Support and Downloads | Tektronix ) and select Software. The 4200A-SCS Clarius+ …Anwendungsgebiet 4200A-CLARIUS-V1.3
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FAQs – Häufig gestellte Fragen FAQ-ID I have lost the device library on the 4200A-SCS, how to get it back?
The best way to get the library back is to re-install Clarius the their system. It’s free from our Tek.com website. Here is the link :https://www.tek.com/software/clarius/1-3247546 Is there a resettable fuse on the interlock circuit for model 4200A-SCS?
Yes, there is a resettable fuse. It takes several minutes to reset, please give it some time.This is discussed on page 4 and 5 of the included application note. Here is a link to the application note on the Tek website: https://www.tek …248681 What is included in the 4200A-SCS Windows 10 Upgrade option?
The 4200A-SCS can be upgraded from the Windows 7 operating system to Windows 10. The part number for this upgrade is 4200A-WIN10-UP. This service will provide a USB flash drive containing the upgrade program files and instructions for installing the …780921 Do I need to calibrate my instruments separately when I upgrade from the 4200-SCS to a 4200A-SCS mainframe?
No; when the 4200A-MF-UP service is selected, the 4200-SCS is converted to the 4200A-SCS mainframe. This system gains the Clarius software. All supported instrument modules in the original system will be moved to the new, 4200A-SCS mainframe and will …780926 Does Model 4200A-SCS support Model 590-CV meter like the Model 4200-SCS?
The Model 590-CV is a stand alone CV meter and can be controlled from either the 4200A-SCS and 4200-SCS using the KIXI (remote interface software).249356 Does the 4200A-SCS support ICCAP?
Although the 4200ICCAP-6.0 driver is obsolete, the 4200A is ICCAP supported through the KXCI software. The 4200 drivers in the KXCI software come with ICCAP in them and all KXCI programs for the 4200 are compatible with the 4200A. Note: ICCAP only …255351 What is the time required to switch between Pulse IV (4225PMU) and CV (4210ACVU) measurements using the 4225-RPM for the 4200A-SCS?
The RPM eliminates the need to re-cable and increases switching speed between Pulsed IV and CV measurements. However, we do not specify the switching time for the RPMs in the data sheets. A simple test using a MDO3102 yeided the below …469646
