DSA8200

Digital Serial Analyzer Sampling Oscilloscope
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Features & Benefits

  • State-of-the-Art Sampling Oscilloscope for Communication Signal Analysis, TDR / TDT / Serial Data Network Analysis, Acquisition, and Measurements of Repetitive Ultrafast Signals
    • Acquisition of Spread Spectrum Clocking (SSC) Signals
    • Industry’s Only Mainframe to Support up to 8 Input Channels for Increased Flexibility and Throughput
    • Four Color-graded, Variable Persistence Waveform Databases
    • Measurement System with Over 100 Automated Measurements
    • Complete Suite of Communications Measurements includes Both Types of OMA, SSC Profile, and Many Others
    • Automated ITU/ANSI/IEEE Mask Testing
    • Masks and Measurements for SONET/SDH, FC, Ethernet, and Other Standards Built-in
    • Mask Updates can be Loaded from Factory-supplied File
    • Mask Margin Testing for Guard Banding Production Testing
  • Acquisition Modules
    • Fully Integrated Multirate Optical Modules
    • Optical Modules up to 80 GHz 80C10B
    • High-accuracy "ER Calibrated" Measurement Available in Some Modules
    • Electrical Modules up to 70+ GHz Bandwidth and 5 ps Measured Rise Time (10-90%)
    • Flexible Rate Clock Recovery
    • Clock Recovery with SSC (Spread Spectrum Clocking) Support Available
  • Jitter, Noise, BER, and Serial Data Link Analysis
    • Measures and Separates Deterministic Data-dependent Jitter from Random Jitter
    • Measures Vertical Noise, Separating Deterministic Data-dependent Noise from Random Noise
    • Highly Accurate BER and Eye Contour Estimation, Support for DDPWS
    • FFE/DFE Equalization, Transmitter Equalization
    • Channel Emulation for Channels with >30 dB of Loss
    • Linear Filter for Fixture De-embedding, Linear Filtering
  • TDR (Time Domain Reflectometry)
    • Up to 50 GHz TDR Bandwidth with 15 ps Reflected Rise Time and 12 ps Incident Rise Time
    • Lowest Noise for Accurate Repeatable TDR Measurement Results – 600 μVRMS at 50 GHz
    • Independent Sampler Deskew ensures Easy Fixture and Probe De-embedding
    • Industry’s Only Mainframe to Accommodate up to Four True-differential TDR or Electrical Channel Pairs for Increased System Versatility
  • S-parameter Measurements
    • Up to 50 GHz Differential, Single Ended, Mixed Mode; Insertion Loss, Return Loss, Frequency Domain Crosstalk, Mode Conversion
    • PCI Express, Serial ATA, Infiniband, Gigabit Ethernet Manufacturing, and Standard Compliance Testing for Gigabit Signal Path and Interconnects – Including Eye Mask Tests
    • Intuitive, Easy, and Accurate for Serial Data, Gigabit Digital Design, and Signal Integrity
    • Fast and Accurate Automated Multiport S-parameter Measurements with Command Line Interface
  • Industry’s Best Standard Time-base Jitter Performance, 800 fsRMS
  • Industry-leading Time-base Jitter Performance, <200 fsRMS*1 Available with Phase Reference Module
  • Fast Acquisition Rate and High Throughput
  • Remote Samplers enabling Placement Near DUT for Superior Signal Fidelity
  • FrameScan™ Acquisition Mode with Eye Diagram Averaging:
    • Isolate Data-dependent Faults
    • Examine Low-power Signals
  • MS Windows XP Operating System
  • Advanced Connectivity to 3rd party Software

Applications

  • Design/Verification of Telecom and Datacom Components and Systems
  • Manufacturing/Testing for ITU/ANSI/IEEE/SONET/SDH Compliance
  • High-performance True-differential TDR Measurements
  • Advanced Jitter, Noise, and BER Analysis
  • Impedance Characterization and Network Analysis for Serial Data Applications including S-parameters
  • Channel and Eye Diagram Simulation and Measurement-based SPICE Modeling

*1 Typical, with the Phase Reference module, some conditions apply. Without the module, the jitter is <800 fsRMS (typical).

Superior Performance with Extraordinary Versatility

For developing today’s high-speed serial devices, the DSA8200 Digital Serial Analyzer sampling oscilloscope is the most versatile tool for communication, computer and consumer electronics gigabit transmitter and signal path characterization, and compliance verification. With exceptional bandwidth, signal fidelity, and the most extensible modular architecture, the DSA8200 provides the highest performance TDR and interconnect analysis, most accurate analysis of signal impairments, and BER calculations for current and emerging serial data technology.

The DSA8200 provides unmatched measurement system fidelity with ultra-low jitter floor that ensures the most accurate acquisition of high-speed signals. You get advanced analysis benefits from the 200 fs acquisition jitter with the Phase Reference module. And in another step forward for a sampling oscilloscope, with the help of the Phase Reference module the DSA8200 can acquire and measure SSC (Spread Spectrum Clocking) signals.

The multiprocessor architecture, with dedicated per-slot digital signal processors (DSPs), provides fast waveform acquisition rates, reducing the test times necessary for reliable characterization and compliance verification.

The DSA8200’s versatile modular architecture supports a large and growing family of plug-ins enabling you to configure your measurement system with a wide variety of electrical, optical, and accessory modules that best suit your application now and in the future. With 6 module slots, the DSA8200 can simultaneously accommodate a Clock Recovery module, a precision Phase Reference module, and multiple acquisition modules, electrical or optical, so you can match system performance to your evolving needs.

Featuring industry-leading signal fidelity, the family of electrical modules includes bandwidth performance from 12 GHz to 70+ GHz. Two true-differential Time Domain Reflectometer (TDR) modules, with remote samplers, offer up to 50 GHz bandwidth and 15 ps reflected rise time and 12 ps incident rise time. The family of low-noise variable-bandwidth electrical modules provides the industry's best noise performance with remote samplers, featuring 450 μVRMS noise at 60 GHz, and 300 μVRMS at 30 GHz.

DSA8200 optical modules provide complete optical test solutions with superior system fidelity from 125 Mb/s to 43 Gb/s and beyond. The modules cover a range of wavelengths for both single- and multi-mode fibres. Each module can be optionally configured with a number of selectable optical reference receiver (ORR) filters and/or a full bandwidth path. The 80C07B, 80C08C, and 80C11 can be configured with a number of available flexible integrated clock recovery options. The 80C12 and 80C14 Multirate module clock recovery support is achieved with an electrical output for use with the 80A05 module, or CR175A/CR125A instruments.

The DSA8200’s popular FrameScan™ acquisition mode can be used with patterns from DUTs, BERTs, and other sources, to isolate pattern-dependent effects in transmitters or show the bit sequence preceding a mask violation. FrameScan automatically sequences the time base so that each bit of the data stream is acquired in time order. When used in combination with mask-testing conditional acquisition features of the DSA8200, such as stop after mask hits, FrameScan can automatically identify at which bit a pattern-dependent failure occurred.

In addition, specialized modules supporting features such as single-ended and differential electrical clock recovery, electrostatic protection for the TDR, and connectivity to the popular TekConnect probing system brings you the performance of Tektronix state-of-the-art probes for high-impedance and differential probing. Low-impedance probes for 50 Ω probing and for TDR probing are also available.

Jitter, Noise, BER, and Serial Data Link Analysis

High-speed serial data link measurements and analysis are supported with three software solutions: 80SJARB, 80SJNB Essentials, and 80SJNB Advanced.

80SJARB is a basic jitter measurement tool capable of measuring jitter on any waveform – random or repetitive. The simplicity of acquisition limits the amount of analysis possible so only the simplest decomposition can be used; repeatability is pattern dependent.

80SJNB Essentials offers complete analysis of jitter, noise, and BER, with decomposition of components for clear understanding of a signal’s problems and margins. The acquisition methodology requires a repetitive pattern. Both accuracy and repeatability are improved relative to 80SJARB since the tool has access to the complete signal pattern.

80SJNB Advanced adds features to 80SJNB Essentials for Serial Data Link Analysis – de-embedding of fixture, channel emulation, FFE/DFE equalization, pre-emphasis/de-emphasis.

TDR (Time Domain Reflectometry)

The DSA8200 is the industry’s highest performance fully integrated Time Domain Reflectometry (TDR) measurement system. Offering true-differential TDR measurements up to 50 GHz bandwidth with 15 ps reflected rise time and 12 ps incident rise time, you are able to keep pace with today’s most demanding Serial Data Network Analysis (SDNA) requirements.

The 80E10 and 80E08 TDR modules feature a fully integrated independent dual-channel 2-meter remote sampler system to minimize fixturing and assure optimal system fidelity. Independent sampler deskew ensures fast and easy fixture and probe de-embedding. The user can characterize differential crosstalk by using TDR steps from a differential module to drive one line pair while monitoring a second line pair with a second differential module.

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TDR and electrical modules with fully integrated remote sampler.

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Small form factor remote sampler enables placement near DUT assuring optimal signal fidelity.

The DSA8200 is the industry’s most versatile TDR measurement system, accommodating up to 4 dual-channel true-differential TDR modules for fast, accurate multilane impedance and S-parameter characterization.

The P80318 True-differential TDR probe and P8018 Single-ended Passive Handheld TDR probe provide high-performance probing solutions for circuit board impedance and electrical signal characterization. The P80318, an 18 GHz 100 Ω input impedance differential TDR hand probe, enables high-fidelity impedance measurements of differential transmission lines. The adjustable probe pitch enables a wide variety of differential line spacing and impedances. The P8018 is a 20 GHz Single-ended Passive Handheld TDR probe. Both the P80318 and P8018 can be used as stand-alone probes but are especially designed to work with the 80A02 for the control of EOS/ESD protection.

Gigabit Signal Path Characterization and Analysis – Serial Data Network Analysis (SDNA)

As clock speeds and rise times of digital circuits increase, interconnect signal integrity dramatically affects digital system performance. Accurate and efficient Serial Data Network Analysis (SDNA) of the signal path and interconnects in time and frequency domains is critical to predict signal losses, jitter, crosstalk, terminations and ringing, digital bit errors, and eye diagram degradation, ensuring reliable system operation.

Tektronix offers several true-differential TDR modules, which in combination with IConnect® software, allow S-parameters measurements with up to –70 dB of dynamic range. This performance assures accurate repeatable measurement in serial data analysis, digital design, signal integrity, and electrical compliance testing applications.

The table below summarizes the S-parameter measurement bandwidth performance when IConnect and the true-differential TDR modules are used in combination.

TDR Module

S-parameter Measurement Bandwidth Performance

80E10

50 GHz

80E08

30 GHz

80E04

20 GHz

With the long record length acquisitions, IConnect® provides great flexibility for obtaining the desired frequency range and frequency step when performing S-parameter measurements. Up to 1,000,000 points can be acquired*2.

When you employ IConnect® Signal Integrity TDR and S-parameter software with the DSA8200 you have an efficient, easy-to-use, and cost-effective solution for measurement-based performance evaluation of multi-gigabit interconnect links and devices, including signal integrity analysis, impedance, S-parameter, and eye-diagram tests, and fault isolation. IConnect can help you complete interconnect analysis tasks in minutes instead of days, resulting in faster system design time and lower design costs. IConnect also enables impedance, S-parameters, and eye-diagram compliance testing as required by many serial data standards, as well as full channel analysis, Touchstone (SnP) file output, and SPICE modeling for gigabit interconnects.

*2 Long record lengths are supported only on DSA8200, CSA8200, TDS8200, CSA8000, and TDS8000 platforms.

Failure Analysis – Quickly Identify Fault Location

The 80E10, with its 12 ps typical TDR rise time, provides superior resolution enabling the fastest and most efficient fault isolation in package, circuit board, and on-chip failure analysis applications.

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Quickly identify the exact location of faults with the 80E10’s sub-millimeter resolution and IConnect True Impedance Profile.

Advanced Communication Signal Analysis

Specifically designed for ultra high-performance optical and electrical serial data applications, the DSA8200 is the ideal tool for design characterization and validation, as well as manufacturing test of datacom and telecom components, transceiver subassemblies, and transmission systems. The DSA8200 generates measurement results, not just raw data, with time and amplitude histograms, mask testing, and statistical measurements. It provides a communications-tailored measurement set that includes jitter, noise, duty cycle, overshoot, undershoot, OMA, extinction ratio, Q-factor, mean optical power, and amplitude. In addition, you can do mask testing of SONET/SDH, 100 Gigabit (4×25), 10 Gigabit, Gigabit Ethernet, and other electrical and optical standards compliance verification. Color grading and intensity grading of waveform data adds a third dimension, sample density, to your signal acquisitions and analysis to provide visual insight. In addition, the variable persistence database feature enables exact data aging to all of the functions, and facilitates eye measurements on DUTs under adjustment.

OpenChoice® Software Enables Familiar Tools to Extend Your Measurement System

The DSA8200 provides an open Windows environment offering new levels of data analysis on the instrument using your favorite commercially available third-party software packages. Additionally, TekVISA™, a standard software accessory, allows the instrument to be placed under the control of software applications (such as LabVIEW, LabWindows, Visual Basic, Microsoft Excel, C, etc.) running on the instrument or on an external PC workstation's network connected to the instrument without the need of a GPIB hardware interface. Plug-and-play drivers for LabVIEW and other programs are also supplied.

The DSA8200 combines the familiarity of Microsoft's Windows XP operating system with world-class waveform acquisition technology. This platform provides a wide array of standard instrumentation and communications interfaces, including: GPIB, parallel printer port, RS-232-C, USB serial ports, and an Ethernet LAN connection. In addition, the platform includes a DVD-CD/RW combo drive and removable hard drive for storage of waveforms, setups, and analysis results.

155 Mb/s to 14+ Gb/s Optical Test

Tektronix optical modules for DSA8200 offer highest level of integration in the industry, with corresponding higher repeatability and transferability of the result. A particularly method-sensitive measurement, Extinction Ratio (ER) is now also available as ER Calibrated, with an additional layer of improvement to the portability of the result (80C08C, 80C11, and 80C14 modules only).

80C14 14 GHz Broad Wavelength Multirate 14 Gb/s Optical Module

The new 80C14 is a broad-wavelength (700 to 1650 nm) multirate optical sampling module that supports 10 Gb/s applications including both datacom and telecom. The supported datacom applications include 10GbE at 9.95, 10.31, 11.09 Gb/s and 8G Fibre Channel, 10G Fibre Channel, 16G Fibre Channel applications at 8.5, 10.51, 11.3, 14.025 Gb/s. The 80C14 also provides telecom rate testing at 9.95, 10.66, 10.70, and 12.5 Gb/s. 14G Infiniband FDR is also supported at 14.063 Gb/s.

With its amplified O/E design, the 80C14 provides excellent signal-to-noise performance and high optical sensitivity, allowing users to examine low-power optical signals. Clock recovery for the 80C14 is provided by the CR175A or CR286A Clock Recovery Instrument (sold separately).

80C08C 10 GHz Broad Wavelength Multirate 10 Gb/s Optical Module

The 80C08C is a broad-wavelength (700 to 1650 nm) multirate optical sampling module providing datacom rate testing for 10GbE applications at 9.95, 10.31, 11.09 Gb/s and 10G Fibre Channel applications at 10.51 Gb/s. The 80C08C also provides telecom rate testing with several filters between 9.95 and 11.3 Gb/s. With its amplified O/E design, this module provides excellent signal-to-noise performance and high optical sensitivity, allowing users to examine low power level optical signals. The 80C08C can be optionally configured with integrated clock recovery options that can support any standard or user-defined rate in a continuous range from 9.8 to 12.6 Gb/s.

80C12 Up to 10 GHz Broad Wavelength Multirate 1 Gb/s to 10 Gb/s Optical Module

The 80C012 is a broad-wavelength (700 to 1650 nm) multirate optical sampling module providing 1G, 2G, and 4G telecom and datacom testing. This highly flexible module can be configured to support either lower data rate applications (1 to 4 Gb/s) or a wide variety of 10 Gb/s applications. The low data rate applications include: 1, 2, and 4 Fibre Channel and “by 4” wavelength division multiplex standards such as 10GBase-X4 and 4-Lane 10 Gb/s Fibre Channel. The supported 10 Gb/s applications include both datacom and telecom. The supported 10 Gb/s datacom applications include 10GbE at 9.95, 10.31, 11.09 Gb/s, 8G Fibre Channel, and 10G Fibre Channel applications at 8.5 Gb/s, 10.51, and 11.3 Gb/s. The 80C12 also provides telecom rate testing at 9.95, 10.66, and 10.70 Gb/s. With its amplified O/E design, this module provides excellent signal-to-noise performance and high optical sensitivity, allowing users to examine low power level optical signals. Clock recovery for the 80C12 is provided through the 80A05 module or CR125A instrument (sold separately).

80C11 30 GHz Long Wavelength Multirate 10 Gb/s Optical Module

The 80C11 is optimized for testing of long wavelength signals (1100 to 1650 nm) at a number of rates around 10 Gb/s with a highly flexible multirate filter. Additionally the high optical bandwidth of 30 GHz (typical) and the excellent frequency response of its full bandwidth path is well suited for general purpose high-performance optical component testing. The 80C11 can be configured with clock recovery options that supports any standard or user-defined rate from 9.8 to 12.6 Gb/s.

80C07B 2.5 GHz Broad Wavelength Multirate 155 Mb/s to 2.5 Gb/s Optical Module

The 80C07B is a broad-wavelength (700 to 1650 nm) multirate optical sampling module optimized for testing datacom/telecom signals from 155 to 2500 Mb/s. With its amplified O/E design, this module provides excellent signal-to-noise performance, allowing users to examine low-power optical signals. The 80C07B can be optionally configured with multirate clock recovery that operates from 155 to 2.7 Mb/s.

40 Gb/s and 100 Gb/s Optical Test

80C10B Multirate Datacom and Telecom 40 Gb/s and 100 Gb/s

The 80C10B module provides integrated and selectable reference receiver filtering, enabling compliance testing at either 1310 nm or 1550 nm for 39.813 Gb/s (OC-768/STM-256, VSR2000 G.693, 40G NRZ G.959.1), 41.25 Gb/s (40GBase-FR), and 43.018 Gb/s [G.709 FEC, OTU3, (4x10G LAN PHY)] rates. In addition to the filter rates, the user may also choose selectable bandwidths of 30 GHz, 65 GHz, and 80 GHz for 80C10B for optimal noise vs. bandwidth performance for accurate signal characterization. The 80C10B is optionally available with Option F1 which extends filter selections to include 27.739 Gb/s (100GBase-LR4 + FEC and 100GBase-ER4 + FEC), and 25.781 Gb/s (100GBase-LR4 and 100GBase-ER4). When equipped with Option CRTP, an electrical signal pickoff is provided for clock recovery using an external module (such as the Tektronix CR286A-HS). The 80C10B is also optionally available in a bundled ordering configuration which includes a 70+ GHz electrical sampling channel.

80C25GBE Multirate Datacom 100 Gb/s

80C25GBE module provides 65 GHz full bandwidth with integrated selectable reference receiver filtering, enabling compliance testing at either 1310 nm or 1550 nm for 27.739G (100GBase-LR4 + FEC and 100GBase-ER4 + FEC), and 25.781G (100GBase-LR4 and 100GBase-ER4). When equipped with Option CRTP, an electrical signal pickoff is provided for clock recovery using an external module (such as the Tektronix CR286A-HS).

Performance You Can Count On

Depend on Tektronix to provide you with performance you can count on. In addition to industry-leading service and support, this product comes backed by a one-year warranty as standard.

Optical Modules: 80C07B

Module  

80C07B

Opt.

F1

F2

F3

F4

F5

F6

F7

F8

F9

F10

CR1

Bandwidth (GHz)

2.5

2.5

2.5

2.5

2.5

2.5

2.5

2.5

2.5

2.5

2.5

Wavelength Range (nm)

700-1650

700-1650

700-1650

700-1650

700-1650

700-1650

700-1650

700-1650

700-1650

700-1650

700-1650

Fibre Input (μm)

9 or 50 or 62.5

9 or 50 or 62.5

9 or 50 or 62.5

9 or 50 or 62.5

9 or 50 or 62.5

9 or 50 or 62.5

9 or 50 or 62.5

9 or 50 or 62.5

9 or 50 or 62.5

9 or 50 or 62.5

9 or 50 or 62.5

Mask Test Sensitivity (dBm)

–22

–22

–22

–22

–22

–22

–22

–22

–22

–22

–22

Number of Channels

1

1

1

1

1

1

1

1

1

1

1

Rates Supported: ▪=Filter, ♦=Optical Clock Recovery, ⊕=Electrical Clock Recovery

125 Mb/s*3

   

   

   

   

   

   

155 Mb/s

   

   

   

   

   

   

622 Mb/s

   

   

   

   

   

   

1063 Mb/s

   

   

   

   

   

   

1250 Mb/s

   

   

   

   

   

   

2125 Mb/s

   

   

   

   

   

   

2488 Mb/s

2500 Mb/s

3.125 Gb/s

   

   

   

   

   

   

   

   

   

   

   

3.188 Gb/s

   

   

   

   

   

   

   

   

   

   

   

3.32 Gb/s

   

   

   

   

   

   

   

   

   

   

   

4.25 Gb/s

   

   

   

   

   

   

   

   

   

   

   

9.95 Gb/s

   

   

   

   

   

   

   

   

   

   

   

*3 125 Mb/s is supported by selecting 155 Mb/s rate.

Optical Modules: 80C08C, 80C10B, 80C11, and 80C25GBE

Module

80C08C

80C10B*5

80C11

80C25GBE

Opt.

 

CR1

CR2

CR4

 

CRTP

F1

 

CR1

CR2

CR3

CR4

 

CRTP

Bandwidth (GHz)

10

10

10

10

80

   

65

30

30

30

30

30

65

   

Wavelength Range (nm)

700-1650

700-1650

700-1650

700-1650

1290-1330

1520-1620

   

1290-1330

1520-1620

1100-1650

1100-1650

1100-1650

1100-1650

1100-1650

1290-1330

1520-1620

   

Fibre Input (μm)

9 or 50 or 62.5

9 or 50 or 62.5

9 or 50 or 62.5

9 or 50 or 62.5

9

   

9

9

9

9

9

9

9

   

Mask Test Sensitivity (dBm)

–16

–15

–15

–15

–7

   

–8

–9

–9

–9

–9

–9

–8

   

Number of Channels

1

1

1

1

1

   

1

1

1

1

1

1

1

   

Rates Supported: ▪=Filter, ♦=Optical Clock Recovery, ⊕=Electrical Clock Recovery

   

   

9.95 Gb/s

   

   

   

   

♦▪

   

   

10.31 Gb/s

   

   

   

   

   

   

   

   

10.52 Gb/s

   

   

   

   

   

   

   

   

   

10.66 Gb/s

   

   

   

   

   

   

   

   

   

10.71 Gb/s

   

   

   

   

   

   

   

   

11.1 Gb/s

   

   

   

   

   

   

   

   

   

   

11.3 Gb/s

   

   

   

   

   

   

   

   

   

   

25.78 Gb/s

   

   

   

   

   

♦*6

   

   

   

   

   

♦*6

27.74 Gb/s

   

   

   

   

   

♦*6

   

   

   

   

   

♦*6

39.81 Gb/s

   

   

   

   

♦*4

   

   

   

   

   

   

♦*4

41.25 Gb/s

   

   

   

   

♦*4

   

   

   

   

   

   

♦*4

43.02 Gb/s

   

   

   

   

♦*4

   

   

   

   

   

   

♦*4

*4 Contact Tektronix for details.

*5 Option CRTP reduces sensitivity by 0.6 dB (max) and increases noise by 15% (max).

*6 Clock recovery with CR286A-HS (sold separately).

{C}Optical Modules: 80C12 and 80C14

Module

80C12

80C14

Opt.

F1

F2

F3

F4

F5

F6

FC

10G

CR*7, 8

 

CR*8

Bandwidth (GHz)

4.25

9

9

4.25

9

9

9

10

   

14

   

Wavelength Range (nm)

700-1650

700-1650

700-1650

700-1650

700-1650

700-1650

700-1650

700-1650

   

700-1650

   

Fibre Input (μm)

9 or 50 or 62.5

9 or 50 or 62.5

9 or 50 or 62.5

9 or 50 or 62.5

9 or 50 or 62.5

9 or 50 or 62.5

9 or 50 or 62.5

9 or 50 or 62.5

   

9 or 50 or 62.5

   

Mask Test Sensitivity (dBm)

–19

–19

–19

–19

–19

–19

–19

–14

   

–15

   

Number of Channels

1

1

1

1

1

1

1

1

   

   

   

Rates Supported: ▪=Filter, ♦=Optical Clock Recovery, ⊕=Electrical Clock Recovery

155 Mb/s

   

   

   

   

   

   

   

   

♦*7

   

   

622 Mb/s

   

   

   

   

   

   

   

   

♦*7

   

   

1063 Mb/s

   

   

   

   

   

   

♦*7

   

   

1250 Mb/s

   

   

   

   

   

   

   

   

♦*7

   

   

2125 Mb/s

   

   

   

♦*7

   

   

2488 Mb/s

   

   

   

   

   

   

   

   

♦*7

   

   

2500 Mb/s

   

   

   

   

   

   

   

   

♦*7

   

   

3.125 Gb/s

   

   

   

   

♦*7

   

   

3.188 Gb/s

   

   

   

   

♦*7

   

   

3.32 Gb/s

   

   

   

   

   

   

   

♦*7

   

   

4.25 Gb/s

   

   

   

   

♦*7

   

   

8.5 Gb/s*9

   

   

♦*10

♦*10

9.95 Gb/s

   

   

   

   

   

   

   

♦*8

♦*8

10.31 Gb/s*9

   

   

   

   

   

   

   

♦*8

♦*8

10.52 Gb/s

   

   

   

   

   

   

   

♦*8

♦*8

10.66 Gb/s

   

   

   

   

   

   

   

♦*8

♦*8

10.71 Gb/s

   

   

   

   

   

   

   

♦*8

♦*8

11.1 Gb/s

   

   

   

   

   

   

   

♦*8

♦*8

11.3 Gb/s

   

   

   

   

   

   

   

♦*8

♦*8

12.5 Gb/s

   

   

   

   

   

   

   

   

   

♦*8

14.025 Gb/s

   

   

   

   

   

   

   

   

   

CR175A

14.063 Gb/s

   

   

   

   

   

   

   

   

   

CR175A

*7 With 80A05, CR125A, or CR175A.

*8 With 80A05 Option 10G, CR125A, or CR175A.

*9 Draft version of the 8.5GFC filter. T11 committee redefined this filter at the April 2008 meeting. New 8.5GFC filter, as defined by T11 committee in April 2009, is identical to the 10GBase-R 10.313G filter and is available for 80C12 Option 10G modules and 80C14 modules; and is identified as 10Base-R.

*10 With CR125A or CR175A.

DSA8200 Electrical Modules

TDR Modules: 80E10, 80E08, and 80E04

The 80E10, 80E08, and 80E04 are dual-channel Time Domain Reflectometry (TDR) sampling modules, providing typical 12 ps incident and 15 ps reflected TDR step rise time. Each channel of these modules is capable of generating a fast step for use in TDR mode and the acquisition portion of the sampling module monitors the incident step and any reflected energy. The polarity of each channel’s step can be selected independently. This allows for true-differential or common-mode TDR or S-parameters testing of two coupled lines, in addition to the independent testing of isolated lines. The independent step generation for each channel allows true-differential measurements, which ensures measurement accuracy of nonlinear differential devices.

80E10 and 80E08 feature a small form factor, fully integrated independent 2-meter remote sampler system, enabling the location of the sampler and TDR step generator near the DUT for the best system fidelity. The modules characterize crosstalk by using TDR steps to drive one line (or line pair for differential crosstalk) while monitoring a second line (or line pair) with the other channel (or another module for differential crosstalk). The "rise time filter" function on the DSA8200 mainframe can be used with TDR or crosstalk measurements to characterize expected system performance with slower edge speeds. An optional 2-meter extender cable for the 80E04 is available, which enables placement of the module near the DUT for the best system fidelity.

All modules have independent incident step and receiver deskew to remove the effect of fixtures and probes, enabling faster and easier deskew. The 80E10 Sampling module provides an acquisition rise time of 7 ps, with up to 50 GHz user-selectable equivalent bandwidth (with 50 GHz, 40 GHz, and 30 GHz settings). 80E08 sampling bandwidth is 30 GHz (user-selectable with 30 GHz and 20 GHz settings) and 80E04 sampling bandwidth is 20 GHz. The 20 GHz P8018 single-ended and the 18 GHz P80318 differential variable pitch TDR handheld probes provide excellent performance, ensuring easy and accurate backplane and package measurements.

TDR Module Summary

Module

Typical TDR Rise Time at Full Bandwidth

Bandwidth Performance*12

RMS Noise at Bandwidth*12

Remote Sampler

Incident*11

Reflected*11

80E10

12 ps

15 ps

50 GHz, 40 GHz, and 30 GHz(user selectable)

50 GHz: 600 μV40 GHz: 370 μV 30 GHz: 300 μV

Yes, fully integrated 2-meter cable

80E08

18 ps

20 ps

30 GHz, 20 GHz (user selectable)

30 GHz: 300 μV

20 GHz: 280 μV

Yes, fully integrated 2-meter cable

80E04

23 ps

28 ps

20 GHz

600 μV

No, optional 80N01 – 2-meter extender cable

*11 Values shown are warranted unless printed in an italic typeface which represents a typical value.

*12 Calculated from .35 bandwidth rise time product.

Electrical Modules: 80E09, 80E07, 80E06, 80E03, and 80E01

The 80E09 and 80E07 are dual-channel modules with remote samplers, capable of noise as low as 450 μVRMS at 60 GHz bandwidth and 300 μVRMS noise at 30 GHz bandwidth. Each small form factor remote sampler is attached to a 2-meter cable to minimize the effects of cables, probes, and fixtures to ensure the best system fidelity. User-selectable bandwidth settings (60/40/30 on 80E09 and 30/20 on 80E07) offer optimal noise/bandwidth trade-off.

80E06 and 80E01 are single-channel 70+ and 50 GHz bandwidth sampling modules respectively. 80E06 provides the widest bandwidth and fastest rise time with world-class system fidelity. Both 80E06 and 80E01 provide a superior maximum operating range of ±1.6 V. Both modules can be used with the optional 2-meter extender cable, ensuring superior system fidelity and measurement flexibility.

The 80E03 is a dual-channel 20 GHz sampling module. This module provides an acquisition rise time of 17.5 ps or less. An optional 2-meter extender cable is available.

When used with Tektronix 80SJNB Jitter, Noise, and BER Analysis software, these modules enable separation of both jitter and noise into their constituent components, for insight into the underlying causes of eye closure and obtain highly accurate calculation of BER and 3-D eye contour. When used with the 82A04 Phase Reference module, time-base accuracy can be improved down to 200 fsRMS jitter which, together with the 300 μVRMS noise floor and 14 bits of resolution, ensures the highest signal fidelity for your measurements.

Electrical Module Summary

Electrical Module

Step Response at Full Bandwidth

(10-90%)*11

Number Of Channels

Bandwidth*11, 13

RMS Noise at Bandwidth*11

Remote Sampler

80E09

5.8 ps

2

60/40/30 GHz (user selectable)

60 GHz: 450 μV 40 GHz: 330 μV30 GHz: 300 μV

Yes, fully integrated 2-meter cable

80E07

11.7 ps

2

30/20 GHz (user selectable)

30 GHz: 300 μV20 GHz: 280 μV

Yes, fully integrated 2-meter cable

80E06

5.0 ps

1

70+ GHz

1.8 mV

No, optional 80N01 – 2-meter extender cable

80E03

17.5 ps

2

20 GHz

600 μV

No, optional 80N01 – 2-meter extender cable

80E01

7 ps

1

50 GHz

1.8 mV

No, optional 80N01 – 2-meter extender cable

*11 Values shown are warranted unless printed in an italic typeface which represents a typical value.

*13 Now obsolete module useful with older versions of the mainframe, but not needed with the 8200 Series mainframes.

DSA8200 Accessory Modules

82A04 Phase Reference Module

The 82A04 Phase Reference module enhances the DSA8200 sampling oscilloscope from the industry's standard time-base jitter performance of 800 fsRMS, to the extremely low time-base jitter of <200 fsRMS. Typical application for the Phase Reference module is the acquisition and analysis of very high-speed optical and electrical signals in communication devices and systems. The 82A04 supports both the Triggered mode of operation, which is similar to usual acquisition, and the untriggered Free Run mode where all timing information comes from the customer-supplied clock alone (no trigger signal necessary). When the external clock is not available the module can accept the clock signal from the clock recovery output of the 80Cxx modules, as well as from the 80A05 module or CR125A, CR175A, or CR286A instruments. Additionally 82A04 supports SSC (Spread Spectrum Clocking) operation.

80A05 Electrical Clock Recovery Module

The 80A05 Electrical Clock Recovery module enables clock recovery for electrical signals, as well as internal triggering on the recovered clock. The module recovers clocks from serial data streams for all of the most common electrical standards in the 50 Mb/s to 4.25 Gb/s, around 5 to 6 Gb/s, and from 9.953 Gb/s to 12.5 Gb/s ranges. The module accepts either single-ended or differential signals as its input, providing clock recovery for both. The signal(s) is/are then passed on to the output connectors (at about 50% of the input level) and can be connected to sampling module(s) for differential or single-ended sampling. Option 10G is required for support of standard rates from 9.953 Gb/s to 12.6 Gb/s. Clock recovery for the 80C12 Optical Sampling module is provided through the 80A05 module or CR125A, CR175A, or CR286A instruments.

80A06 PatternSync Module

The 80A06 PatternSync Trigger module, when used in combination with 80SJNB software, enables characterizing jitter, noise, and BER performance of high-speed serial designs from 1 Gb/s to 60 Gb/s data rates. It extends the capability of the DSA8200 sampling oscilloscope by creating a pattern trigger from any data-related clock – a recovered clock, user-supplied clock, sub-clock, or super-clock. The PatternSync Trigger module is programmable to pattern lengths of up to 223 bits and accepts a user-supplied clock signal from 150 MHz to 12.5 GHz. The 80A06 module is required with the DSA8200 when using 80SJNB Advanced Jitter, Noise, and BER Analysis software package. This module can be used in combination with the 82A04 Phase Reference module for the best time-base accuracy or for acquisition of signals under SSC (Spread Spectrum Clocking).

CR125A, CR175A, and CR286A Clock Recovery Instruments

CR125A, CR175A and CR286A Clock Recovery instruments recover clocks from serial data streams for all of the most common electrical standards in the continuous 150 Mb/s to 12.5 Gb/s, 150 Mb/s to 17.5 Gb/s, or 150 Mb/s to 28.6 Gb/s range respectively. Auto-locking capability is selectable from the user interface or programmatic interface, so the design and test engineers can search and lock onto signals of undefined or unknown data rate. The module accepts either single-ended or differential signals as its input, providing clock recovery for both. The signal(s) is/are then passed on to the output connectors and can be connected to sampling module(s) for differential or single-ended sampling. Tektronix clock recovery instruments offer complete configurability and state-of-the-art specifications and are the preferred solution for most serial data standards due to excellent stability, superior jitter and slew rate tolerance for recovering clocks from stressed or degraded signals, and unequaled PLL bandwidth and roll-off shape control for either Golden PLL compliance testing or custom PLL response. The clock recovery instruments also lock on spread-spectrum signals. The CR125A, CR175A, or CR286A can also serve as the Clock Recovery instrument for the 80C10B*14, 80C12, 80C14, or 80C25GBE. For more information on Tektronix Clock Recovery instruments see the BERTScope® CR Series data sheet at www.tektronix.com.

*14 Up to data rates of 28.6 Gb/s.

P80318 Differential Handheld TDR Probe

The P80318 is an 18 GHz 100 Ω input impedance differential TDR hand probe. This probe enables high-fidelity impedance measurements of differential transmission lines. The adjustable probe pitch from 0.5 mm to 4.2 mm enables a wide variety of differential line spacing and impedances. The P80318 probe also includes two precision SMA cables with parallel control lines that provides the 80A02 module the control for EOS/ESD protection.

P8018 Single-ended Handheld TDR Probe

The P8018 Handheld TDR Probe is a 20 GHz, 50 Ω input impedance, single-ended passive probe that provides a high-performance solution for electrical sampling, TDR circuit board impedance characterization, and high-speed electrical signal analysis applications. The P8018 probe also includes a precision SMA cable and parallel control line that provides the 80A02 module the control for EOS/ESD protection.

80A02 EOS/ESD Protection Module

The 80A02 EOS/ESD Protection module protects the sampling bridge of Tektronix electrical sampling module inputs from damage by electrostatic charge. The 80A02 is intended for use in applications such as electrical TDR circuit board testing and cable testing where large static charges can be stored in the DUT.

When used with the matching P8018 20 GHz single-ended handheld probe or the P80318 differential handheld probe (both with probe tip pressure actuating feature) the 80A02 provides a superior technique and performance capability for electrical module EOS/ESD protection of acquired electrical signals and TDR measurements (two 80A02 modules required for differential applications).

80A03 TekConnect Probe Interface Module

The 80A03 provides probe power and control for up to two Tektronix P7000 Series probes. The 80A03 is powered through the oscilloscope and requires no user adjustments or external power cords. An Electrical Sampling module can be plugged directly into the slot on the 80A03 to provide the optimum system fidelity and a short electrical path. Using the 80A03, designers can benefit from industry-leading Tektronix active and differential probes to measure signals on SMD pins and other challenging circuit features.

SlotSaver Small Module Extender Cable

This cable can be used to power and operate one 80A02 or 80A06 accessory module, eliminating the need to consume a small form factor mainframe slot. The SlotSaver extender cable plugs into the ‘Trigger Power’ connector on the mainframe or (for 80A02) into the ‘Probe Power’ connector on most Electrical Sampling modules.

DSA8200 Application Software

Jitter, Noise, BER, and Serial Data Link Analysis (SDLA) Software

80SJNB speeds the identification of the underlying causes of both horizontal and vertical eye closure through separation of jitter and noise. With its unique insight into the constituent components of both jitter and noise, 80SJNB provides a highly accurate and complete BER calculation and eye contour analysis.

Additionally available in the software package is the first-ever set of features addressing the design issues of modern Serial Data Links: equalization with either FFE or DFE, channel emulation, support for fixture de-embedding, as well as full support for SSC – Spread Spectrum Clocking. When you combine jitter, noise, and BER analysis with the DSA8200 modular flexibility, uncompromised performance, and unmatched signal fidelity you get the ideal solution for next-generation high-speed serial data design validation and compliance testing. 80SJNB requires the 80A06 PatternSync module, which creates a trigger pulse on each complete pattern. 80SJNB may be used with the 82A04 Phase Reference module for enhanced accuracy or for SSC signals, or without it depending on your requirements. SSC max. amplitude 5000 ppm (6000 ppm) at 30 ±3 kHz. Version V2.1 and later of 80SJNB supports save and recall of the complete signal description. Also added is a new measurement DDPWS (Data Dependent Pulse Width Shrinkage) and a corresponding graph.

80SJNB Jitter and Noise Analysis Measurements

Jitter Analysis

Measurements

Description

TJ at BER

Total jitter at specified BER

J2

Total jitter for BER = 2.5e–3

J9

Total jitter for BER = 2.5e–10

RJ

Random jitter

RJ(h)

Horizontal component of random jitter

RJ(v)

Vertical component of random jitter

RJ(d-d)

Random jitter according to the Dual Dirac model

DJ

Deterministic jitter

DDJ

Data-dependent jitter

DDPWS

Data-dependent Pulse Width Shrinkage

DCD

Duty cycle distortion

DJ(d-d)

Deterministic jitter computed in the Dual Dirac model

PJ

Periodic jitter

PJ(h)

Horizontal component of periodic jitter

PJ(v)

Vertical component of periodic jitter

EO at BER

Horizontal eye opening at specified BER

80SJNB Noise Analysis

Measurements

Description

RN

Random noise

RN(v)

Vertical component of random noise

RN(h)

Horizontal component of random noise

DN

Deterministic noise

DDN1

Data-dependent noise on logical level 1

DDN0

Data-dependent noise on logical level 0

PN

Periodic noise

PN(v)

Vertical component of periodic noise

PN(h)

Horizontal component of periodic noise

EO at BER

Vertical eye opening at specified BER

SSC Magnitude

Magnitude of SSC modulation in ppm

SSC Frequency

Frequency of SSC modulation in ppm

80SJNB Advanced Supports:

  • FFE (Feed Forward Equalization) to 100 Taps
  • DFE (Decision Feedback Equalization) to 40 Taps
  • Filter for support of linear filters from fixture de-embed to transmitter equalization. Channel emulation supported for channels with >30 dB of loss at 1st harmonic frequency
Jitter Analysis of Arbitrary Data
Thumbnail

The 80SJARB jitter measurement application software for the DSA8200 Series addresses IEEE 802.3ba applications requiring the J2 and J9 jitter measurements. It also enables basic jitter measurements for NRZ data signals including PRBS31, random traffic, and scrambled data. This provides an entry-level jitter analysis capability with simple Dual Dirac model jitter analysis and no hardware module requirements. 80SJARB can acquire continuously in “free run” mode, delivering acquisitions and updates beyond the IEEE minimum requirement of 10,000 data points. Plots include jitter bathtub curves for both measured and extrapolated data, as well as a histogram of the acquired data.

Measurement

Description

J2

Total jitter for BER = 2.5e–3

J9

Total jitter for BER = 2.5e–10

Tj

Total jitter for BER = 1.0e–12

DJdd

Deterministic jitter (Dual Dirac model)

RJdd

Random jitter (Dual Dirac model)

  • Free Run Mode: For continuous acquisitions and update beyond the IEEE minimum requirement of 10,000 data points
  • Plots: Jitter / Eye Opening Bathtub, Histogram of Acquired Data

IConnect® Signal Integrity TDR and S-parameter Software

Operating on the DSA8200 TDR platform, IConnect® S-parameters is the most cost-effective and highest throughput approach for S-parameter measurements in digital design, signal integrity analysis, and interconnect compliance testing, providing as much as 50% cost savings compared to similar bandwidth VNAs, and dramatically speeding up measurements. You can also take advantage of the IConnect® S-parameters command line interface, which automates the S-parameter measurements, to the overall suite of manufacturing tests you perform using your TDR instrument, significantly reducing test time while increasing measurement repeatability.

The simplicity of S-parameter calibration using a reference (open, short, or through), and an optional 50 Ω load makes the measurement, fixture de-embedding, and moving the reference plane a snap. Touchstone file format output enables easy S-parameter file sharing for further data analysis and simulations.

Tektronix offers several true-differential TDR modules, which in combination with IConnect® offers S-parameter measurements to 50 GHz with up to 70 dB of dynamic range. This performance exceeds requirements for serial data analysis, digital design, and signal integrity applications, resolving down to 1% (–40 dB) accuracy of crosstalk, whereas electrical compliance testing masks typically call for the measurements in the –10 to –30 dB range.

IConnect® software allows you to quickly and easily generate SPICE and IBIS models for your PCBs, flex boards, connectors, cables, packages, sockets, and I/O buffer inputs directly from TDR/T or VNA S-parameter measurements. IConnect® allows you to display eye diagram degradation, jitter, loss, crosstalk, reflections, and ringing in your digital system. IConnect® Linear Simulator allows the designer to link several interconnect channels together to evaluate the total time, frequency domain performance, and eye diagram of the overall channel. IConnect® substantially simplifies the signal integrity analysis of the interconnect link, equalization and emphasis component design, and analysis of the interconnect link with transmitter and receiver.

 

Characteristics

Signal Acquisition

Acquisition Modes

Mode

Sample (Normal), Envelope, and Average

Number of Sampling Modules Accommodated

Up to four dual-channel electrical; up to two optical sampling modules. (Both single- and dual-channel modules are appropriate for the two channels associated with the slot)

Population of the CH1/CH2 large slot with any module other than one requiring power only displaces functionality of the CH1/CH2 small slot; population of the CH3/CH4 large slot with any module other than one requiring power only displaces functionality of the CH3/CH4 small slot

Number of Simultaneously Acquired Inputs

Eight channels maximum

Acquisition Characteristics

Characteristic

Description

Vertical Systems

Rise Time / Bandwidth

Determined by the sampling modules used

Vertical Resolution

14 bits over the sampling modules' dynamic range

Horizontal System

Four time-base modes are available:

   Triggered Phase Reference*15 Time Base Mode

Timing information extracted from a user-supplied or clock recovery signal significantly improves time-base accuracy and jitter performance of the triggered acquisition. Horizontal position is referenced to the trigger signal as with a traditional time base

   Free Run Phase Reference*15 Time Base Mode

All timing is based on a phase reference signal; accuracy and jitter as above; no trigger is needed, and correspondingly there is no timing relation to trigger signal

   Short-term Optimized Sequential*16 Time Base Mode

Best short-delay performance for acquisitions without the external phase reference signal

   Locked to 10 MHz Reference Sequential Time Base

Provides the best long-delay performance for acquisitions without the external phase reference signal. The Lock is selectable between Lock to Internal 10 MHz and Lock to External 10 MHz for highest frequency accuracy

Main and Magnification View Time Bases

100 fs/div to 5 ms/div in 1-2-5 sequence or 100 fs increments

Maximum Trigger Rate

200 kHz; in Phase Reference mode: 50 kHz

Maximum Acquisition Rate

200 kS/s per channel (standard sequential time base); 50 kS/s (Phase Reference modes)

Time Interval Accuracy (Standard Time Base) and Timing Deviation (Phase Reference Modes)

Phase Reference Time Base: Triggered

Maximum timing deviation relative to phase reference signal:

   Horizontal position after trigger event:

      >40 ns

0.2% of phase reference signal period (typical)

      ≤40 ns

0.4% of phase reference signal period (typical)

Note: The performance depends on stable clock supplied to the Phase Reference module. Performance under SSC is lower and depends on modulation shape

Phase Reference Time Base: Free Run

Maximum timing deviation relative to phase reference signal: 0.1% or better of phase reference signal period (typical)

Sequential Time Base*16

   Time interval accuracy, horizontal scale:

      <21 ps/div

1 ps + 1% of interval

      ≥21 ps/div

8 ps + 0.1% of interval (short-term optimized mode)

8 ps + 0.01% of interval (locked to 10 MHz mode)

Horizontal Deskew Range Available*17 (Sequential time base only)

–500 ps to +100 ns on any individual channel in 100 fs increments

DSA8200 Record Length

20, 50, 100, 250, 500, 1000, 2000, or 4000 samples;

Longer records available as follows:

   IConnect®

1,000,000 points

   80SJNB Jitter, Noise, and BER Analysis software

3,200,000 points

Waveform Databases

4 independently accumulated waveform records of up to 4 G waveform points. Variable waveform database mode with true first-in/first-out of 2000 waveforms available on each of 4 waveform databases

Magnification Views

In addition to the main time base, the DSA8200 supports two magnification views. These magnifications are independently acquired using separate time-base settings which allow same or faster time/div than that of the main time base

*15 When using the 82A04 Phase Reference module.

*16 Traditional mode – not using the 82A04 Phase Reference module.

*17Mainframe deskew only. The 80E07, 80E08, 80E09, and 80E10 include additional channel deskew range.

Trigger System

Trigger Sources

External direct trigger.

External pre-scaled trigger.

Internal clock trigger: Internally connected to direct trigger.

Clock recovery triggers from Optical Sampling modules and from the 80A05 module (pre-scaled above 2.7 Gb/s) internally connected.

Phase Reference*15 time base supports acquisitions without a trigger signal in its Free Run mode.

*15 When using the 82A04 Phase Reference module.

Trigger Sensitivity

External Direct Trigger Output

50 mV, DC - 4 GHz (typical)

100 mV, DC - 3 GHz (guaranteed)

Trigger Level Range

±1.0 V

Trigger Input Range

±1.5 V

Trigger Holdoff

Adjustable 5 μs to 100 ms in 0.5 ns increments

External Trigger Gate (Optional)

TTL logic 1 enables gate, a TTL logic 0 disables gate, maximum nondestruct input level ±5 V

Pre-scaled Trigger Input

200 mVp-p to 800 mVp-p, 2 to 12.5 GHz (guaranteed)

Time-base Jitter

Phase Reference*18 Time Base

System jitter of 200 fsRMS typical on a 10 GHz or faster acquisition module, with f ≥ 8 GHz, 0.6 V ≤ VREF ≤ 1.8 V phase reference signal

Jitter: System jitter of 280 fsRMS typical on a 10 GHz or faster acquisition module, in DSA8200 mainframe, with 2 GHz ≤ f ≤ 8 GHz, 0.6 V ≤ VREF ≤ 1.8 V phase reference signal

The phase reference time base remains operational to 100 mV (typical) with increased jitter

Short-term Jitter Optimized Sequential Mode

800 fsRMS +5 ppm of position (typical)

1.2 psRMS +10 ppm of position (max.)

Locked to 10 MHz Reference Sequential Mode

1.6 psRMS +0.04 ppm of position (typical)

2.5 psRMS +0.01 ppm of position (max.)

Internal Clock

Adjustable from 25 to 200 kHz (drives TDR, internal clock output and calibrator)

*18 When using the 82A04 Phase Reference module performance under SSC is lower and depends on modulation shape, clock recovering setting, and cabling lengths.

Display Features

Touch Screen Display

264 mm / 10.4 in. diagonal, color

Colors

16,777,216 (24 bits)

Video Resolution

640 horizontal by 480 vertical displayed pixels

Monitor Type

LCD

Math/Measurement

Characteristic

Description

System Measurements

The DSA8200 supports up to eight simultaneous measurements, updated three times per second with optional display of per-measurement statistics (min, max, mean, and standard deviation)

Measurement Set

Automated measurements include RZ, NRZ, and Pulse signal types, and the following:

   Amplitude measurements

High, Low, Amplitude, Max, Mid, Min, +Width, Eye Height, Eye Opening Factor, Pulse Symmetry, Peak-to-Peak, OMA, +Overshoot, –Overshoot, Mean, +Duty Cycle, Cycle Mean, RMS, Cycle RMS, AC RMS, Gain, Extinction Ratio (Ratio, %, dB), Suppression Ratio (Ratio, %, dB), Peak-to-Peak Noise, RMS Noise, Q-Factor, SNR, Average Optical Power (dBm, watts), OMA

   Timing measurements

Rise, Fall, Period, Bit Rate, Bit Time, Frequency, Crossing (%, Level, Time), +Cross, –Cross, Jitter (P-P, RMS), Eye Width, +Width, –Width, Burst Width, +Duty Cycle, –Duty Cycle, Duty Cycle Distortion, Delay, Phase

   Area measurements

Area, Cycle Area

Cursors

Dot, vertical bar, and horizontal bar cursors

Waveform Processing

Up to eight math waveforms can be defined and displayed using the following math functions: Add, Subtract, Multiply, Divide, Average, Differentiate, Exponentiate, Integrate, Natural Log, Log, Magnitude, Min, Max, Square Root, and Filter. In addition, measurement values can be utilized as scalars in math waveform definitions

Mask Testing –

Standard rate (Gb/s) unless otherwise noted

For many applications, masks will be found in the following list of predefined, built-in masks. To get a list of all currently available masks contact your local Tektronix representative.

File-based masks are used to distribute new, Tektronix factory created, updated masks as a file loadable by the firmware. User-defined masks allow the user to create (through UI or PI) user masks

STM-0/OC-1 51 Mb/s

STM-1/OC-3 155 Mb/s

STM-4/OC-12 622 Mb/s

STM-16/OC-48 2.488

STM-64/OC-192 9.953

STM-256/OC-768 39.813

FEC 2.666 2.666

FEC 10.66 10.664

FEC 10.709

FEC 11.100

FEC 27.739 Gb/s (100GBase-LR4 100GBase-ER4)

FEC 42.66 42.657

FEC 43 Gb/s G.709 43.018

FC-10 G 10.5188 – optical only

FC-16 17.0 – optical and electrical

FC-133 132.813 Mb/s – optical and electrical

FC-266 265.6 Mb/s – optical and electrical

FC-531 531.2 Mb/s – optical and electrical

FC-1063 1.063 – optical and electrical

FC-2125 2.125 – optical and electrical

FC-4250 4.250 – optical and electrical

FC-8500 8.500 – optical and electrical, optical 10GFC, FEC 11.3*9

Mask Testing Cont.

16GFC MM r6.1 14.025000 Gb/s

16GFC SM r6.1 14.025000 Gb/s

10GBase-X4 3.125

10GBase-W 9.953

10GBase-R 10.313, FEC 11.1, 8.5 GFC

40GBase-LR4 10.312500 Gb/s

40GBase-SR4 10.312500 Gb/s

40GBase-FR 41.250000 Gb/s

100GBase-ER4 25.781250 Gb/s

100GBase-LR4 25.781250 Gb/s

100GBase-SR10 10.31250 Gb/s

InfiniBand 2.500 – optical and electrical

Gigabit Ethernet 1.250

Gigabit Ethernet 2.5 Gb/s

XAUI, XFI

PCI-Express 2.5G

PCI-Express 5.0G

SAS XR 3.0G

SAS XR AASJ 3.0G

SATA G1Tx 1.5G

SATA G1Rx 1.5G

SATA G2Tx 3.0G

SATA G2Rx 3.0G

SATA G3Tx 6.0G

SATA G3Rx 6.0G

Rapid I/O 1.25G

Rapid I/O 2.50G

Rapid I/O 3.125

*9 Draft version of the 8.5GFC filter. T11 committee redefined this filter at the April 2008 meeting. New 8.5GFC filter, as defined by T11 committee in April 2009, is identical to the 10GBase-R 10.313G filter and is available for 80C12 Option 10G modules and 80C14 modules; and is identified as 10Base-R.

Optical Sampling Module Characteristics

Refer to Optical Sampling module's User Manual for more detailed information.

Optical Sampling Module Characteristics

Module

Application Type

Standards and Supported Filtering Rates*19

Number of Input Channels

Effective Wavelength Range

Calibrated Wavelengths

80C07B

Tributary Datacom/Telecom

Standard Included: OC-48/STM-16 (2.488 Gb/s), Infiniband SDR, 2 GbE (2.500 Gb/s);

Optional (choose any two): OC-3/STM-1 (155 Mb/s), OC-12/STM-4 (622 Mb/s), Fibre Channel (1.063 Gb/s), GbE (1.250 Gb/s), 2G Fibre Channel (2.125 Gb/s)

1

700 nm to 1650 nm

780 nm, 850 nm, 1310 nm, and 1550 nm (±20 nm)

80C08C

10 Gb/s Datacom/Telecom

OC-192/STM-64 (9.953 Gb/s), 10GBase-W (9.953 Gb/s), 10GBase-R, 40GBase-R4, 100GBase-SR10 (10.31 Gb/s), 10G Fibre Channel (10.52 Gb/s), ITU-T G.975 FEC (10.664 Gb/s), ITU-T G.709 (10.709 Gb/s), 10 GbE FEC (11.1 Gb/s), 10 GFC FEC (11.3 Gb/s), 10GBase-LRM, 40GBase-SR4, 100GBase-SR10, 40GBase-LR4

1

700 nm to 1650 nm

780 nm, 850 nm, 1310 nm, and 1550 nm (±20 nm)

80C10B

100 Gb/s and 40 Gb/s Telecom and Datacom

OC-768/STM-256 (39.813 Gb/s), OTU3, VSR-2000 G.693, 40G NRZ G.959.1, FEC (43.018 Gb/s), OTU3 (44.5 Gb/s), 40GBase-FR (41.25 Gb/s), 100GBase-LR4 (25.781 Gb/s, FEC 27.739 Gb/s), 100GBase-ER4 (25.781 Gb/s, FEC 27.739 Gb/s)

1

1310 nm and 1550 nm

1310 nm and 1550 nm (±20 nm)

80C11

10 Gb/s Datacom/Telecom

OC-192/STM-64 (9.953 Gb/s), 10GBase-W (9.953 Gb/s), 10GBase-R, 40GBase-LR4 (10.31 Gb/s), 10G Fibre Channel (10.52 Gb/s), ITU-T G.975 FEC (10.664 Gb/s), ITU-T G.709 (10.709 Gb/s), 10 GbE FEC (11.1 Gb/s), 10 GFC FEC (11.3 Gb/s), 40GBase-LR4

1

1100 nm to 1650 nm

1310 nm and 1550 nm (±20 nm)

80C12

1 to 8.5 Gb/s Datacom/Telecom

Fibre Channel (1.063 Gb/s), 2G Fibre Channel (2.125 Gb/s), 4G Fibre Channel (4.250 Gb/s), 10GBase-X4 (3.125 Gb/s), 8G Fibre Channel (8.50 Gb/s)*9, 10GFC-X4 (3.1875 Gb/s), VSR5-3318 (3.318 Gb/s), 1x Infiniband SDR (2.5 Gb/s), 10GBase-LRM, 40GBase-SR4, 100GBase-SR10, 40GBase-LR4

1

700 nm to 1650 nm

850 nm, 1310 nm, and 1550 nm (±20 nm)

10 Gb/s Datacom/Telecom

OC-192/STM-64 (9.953 Gb/s), 10GBase-W (9.953 Gb/s), 10GBase-R*9, 40GBase-R4, 100GBase-SR10 (10.31 Gb/s), 10G Fibre Channel (10.52 Gb/s), ITU-T G.975 FEC (10.664 Gb/s), ITU-T G.709 (10.709 Gb/s), 10 GbE FEC (11.1 Gb/s), 10 GFC FEC (11.3 Gb/s)

80C14

8.5 to 14 Gb/s Datacom/Telecom

8GFC (8.500 Gb/s), OC-192/STM-64 (9.953 Gb/s), 10GBase-W (9.953 Gb/s), 10GBase-R, 40GBase-R4, 100GBase-SR10 (10.31 Gb/s), 10G Fibre Channel (10.52 Gb/s), ITU-T G.975 FEC (10.664 Gb/s), ITU-T G.709 (10.709 Gb/s), 12.5 G+FEC, 10 GbE FEC (11.1 Gb/s), 10 GFC FEC (11.3 Gb/s), 16GFC (14.025 Gb/s), 14G Infiniband FDR (14.0625 Gb/s)

1

700 nm to 1650 nm

850 nm, 1310 nm, and 1550 nm (±20 nm)

80C25GBE

100 Gb/s Datacom

100GBase-LR4 (25.781 Gb/s, FEC 27.739 Gb/s), 100GBase-ER4 (25.781 Gb/s, FEC 27.739 Gb/s)

1

1310 nm and 1550 nm

1310 nm and 1550 nm (±20 nm)

*8 With 80A05 Option 10G, CR125A, or CR175A.

*9 Draft version of the 8.5GFC filter. T11 committee redefined this filter at the April 2008 meeting. New 8.5GFC filter, as defined by T11 committee in April 2009, is identical to the 10GBase-R 10.313G filter and is available for 80C12 Option 10G modules and 80C14 modules; and is identified as 10Base-R.

*19 Bandwidths shown are warranted unless printed in an italic typeface which represents a typical value. 80C08C, 80C12: Bandwidths and optical filters valid for OMA ≤ 500 μW (1550/1310 nm), OMA ≤ 860 μW (850 nm), OMA ≤1020 μW (780 nm).

Note: Refer to Optical Sampling module's User Manual for more detailed information.

Optical Sampling Module Characteristics (Cont.)

Module

Clock Recovery (Optional)

Clock Recovery Outputs

Unfiltered Optical Bandwidth*19

Absolute Maximum Nondestructive Optical Input

Internal Fibre Diameter

80C07B

Option CR1: 155 Mb/s, 622 Mb/s, 1.063 Gb/s, 1.250 Gb/s, 2.125 Gb/s, 2.488 Gb/s, 2.500 Gb/s, 2.666 Gb/s

±Clock, ±Data

2.5 GHz

5 mW average; 10 mW peak power at wavelength of highest responsivity

62.5/125 μmMulti Mode

80C08C*21

Option CR1: 9.953 Gb/s, 10.31 Gb/s;

Option CR2: 10.31 Gb/s, 10.52 Gb/s;

Option CR4: Continuous from 9.8 Gb/s to 12.6 Gb/s

Clock, Clock/16

10 GHz

1 mW average; 10 mW peak power at wavelength of highest responsivity

62.5/125 μmMulti Mode

80C10B

Provided by CR286A-HS or other compatible external CR units*4

ELECTRICAL SIGNAL OUT (to 44.5 Gb/s, 50 Ω, AC coupled, differential 2.92 mm female connectors, max. 1 ps diff. skew)*20

80 GHz

20 mW average; 60 mW peak power at wavelength of highest relative responsivity

9/125 μmSingle Mode

80C11

Option CR1: 9.953 Gb/s;

Option CR2: 9.953 Gb/s, 10.664 Gb/s;

Option CR3: 9.953 Gb/s, 10.709 Gb/s;

Option CR4: Continuous between 9.8 Gb/s to 12.6 Gb/s

CR1: Clock, Clock/16, Data;

CR2, CR3, CR4: Clock, Clock/16

28 GHz

5 mW average; 10 mW peak power at wavelength of highest responsivity

9/125 μmSingle Mode

80C12

Provided by 80A05 or CR125A (sold separately)

ELECTRICAL SIGNAL OUT

9 GHz (for all options except 10G)

10 GHz (Option 10G)

1 mW average; 10 mW peak power at wavelength of highest responsivity

62.5/125 μmMulti Mode

80C14

Provided by CR175A or CR286A (sold separately)

ELECTRICAL SIGNAL OUT (to 14.2 Gb/s, AC coupled, differential)

14 GHz

2 mW average (1310/1550 nm); 4 mW average (850 nm); 10 mW peak power at wavelength of highest responsivity

62.5/125 μm Multi Mode

80C25GBE

Provided by CR286A-HS

ELECTRICAL SIGNAL OUT (to 44.5 Gb/s, 50 Ω, AC coupled, differential 2.92 mm female connectors, max. 1 ps diff. skew)*20

65 GHz

20 mW average; 60 mW peak power at wavelength of highest relative responsivity

9/125 μmSingle Mode

*4 Contact Tektronix for details.

*19 Bandwidths shown are warranted unless printed in an italic typeface which represents a typical value. 80C08C, 80C12: Bandwidths and optical filters valid for OMA ≤ 500 μW (1550/1310 nm), OMA ≤ 860 μW (850 nm), OMA ≤1020 μW (780 nm).

*20 With Option CRTP.

*21 Frequency characteristic and ORR guaranteed for signals up to 500 μWp-p (80C08C, 80C12), respectively 200 μW (80C07B) at 1550 nm; pro-rated (higher power) for other wavelengths.

Optical Sampling Module Characteristics (Cont.)

Module

Optical Return Loss

Fibre Input Accepted

RMS Optical Noise (Typical)

RMS Optical Noise (Maximum)

Independent Channel Deskew

80C07B

>14 dB (Multi Mode)

>24 dB (Single Mode)

Single or Multi Mode

0.50 μW at 155 Mb/s, 622 Mb/s, 1063 Mb/s, 1250 Mb/s;

0.70 μW at 2.488/2.500 Gb/s

1.0 μW at 155 Mb/s, 622 Mb/s, 1063 Mb/s, 1250 Mb/s;

1.5 μW at 2.488/2.500 Gb/s

Standard

80C08C

>14 dB (Multi Mode)

>24 dB (Single Mode)

Single or Multi Mode

1.7 μW at all filter rates (1550/1310 nm, no CR)

3.0 μW at all filter rates (1550/1310 nm)

Standard

80C10B*5

>30 dB

Single Mode

1310 nm

1550 nm

1310 nm

1550 nm

Standard

21 μW (25.8, 27.7 Gb/s)

26 μW (30 GHz)

28 μW (39.8 Gb/s - 43.0 Gb/s)

44 μW (65 GHz)

72 μW (80 GHz)

15 μW (25.8, 27.7 Gb/s)

19 μW (30 GHz)

20 μW (39.8 Gb/s - 43.0 Gb/s)

33 μW (65 GHz)

55 μW (80 GHz)

38 μW (25.8, 27.7 Gb/s)

45 μW (30 GHz)

50 μW (39.8 Gb/s - 43.0 Gb/s)

75 μW (65 GHz)

130 μW (80 GHz)

28 μW (25.8, 27.7 Gb/s)

35 μW (30 GHz)

38 μW (39.8 Gb/s - 43.0 Gb/s)

60 μW (65 GHz)

105 μW (80 GHz)

80C11

>30 dB

Single Mode

5.5 μW at all filter rates;

10.0 μW at 20 GHz

20.0 μW at 30 GHz

8.0 μW at all filter rates;

14.0 μW at 20 GHz

30.0 μW at 30 GHz

Standard

80C12

>14 dB (Multi Mode)

>24 dB (Single Mode)

Single or Multi Mode

1.3 μW (all filters except Option 10G)

2.4 μW ('Full BW' and Option 10G filters)

2.5 μW (all filters except Option 10G)

5.0 μW ('Full BW' and Option 10G filters)

Standard

80C14

>14 dB (Multi Mode)

>24 dB (Single Mode)

Single or Multi Mode

850 nm

1310/1550 nm

850 nm

1310/1550 nm

Standard

2.5 μW (10G filters)

3.7 μW (14G filters)

1.3 μW (10G filters)

1.9 μW (14G filters)

5 μW (10G filters)

7 μW (14G filters)

2.5 μW (10G filters)

3.5 μW (14G filters)

80C25GBE

>30 dB

Single Mode

1310 nm

1550 nm

1310 nm

1550 nm

Standard

21 μW (25.8, 27.7 Gb/s)

44 μW (65 GHz)

15 μW (25.8, 27.7 Gb/s)

33 μW (65 GHz)

38 μW (25.8, 27.7 Gb/s)

75 μW (65 GHz)

28 μW (25.8, 27.7 Gb/s)

60 μW (65 GHz)

*5 Option CRTP reduces sensitivity by 0.6 dB (max) and increases noise by 15% (max).

Optical Sampling Module Characteristics (Cont.)

Module

Offset Capability

Power Meter

Power Meter Range

Power Meter Accuracy

Mask Test Optical Sensitivity*22

80C07B

Standard

Standard

+4 dBm to –30 dBm

5% of reading

–22 dBm at 155 Mb/s, 622 Mb/s;

–20 dBm at 2488/2500 Mb/s

80C08C

Standard

Standard

0 dBm to –30 dBm

5% of reading

–16 dBm at all filter rates

80C10B*5, 80C25GBE

Standard

Standard

+13 dBm to –21 dBm

5% of reading

25.8 and 27.7 Gb/s:

–8 dBm (1550 nm) and –7 dBm (1310 nm);

39.813 to 43.018 Gb/s:

–7 dBm (1550 nm) and –6 dBm (1310 nm)

80C11

Standard

Standard

+4 dBm to –30 dBm

5% of reading

–10 dBm at all filter rates; –7 dBm at 20 GHz;

–4 dBm at 30 GHz

80C12

Standard

Standard

0 dBm to –30 dBm

5% of reading

–19 dBm (for all options except Option 10G)

–14 dBm (for Option 10G)

80C14

Standard

Standard

0 dBm to –30 dBm

5% of reading

–15 dBm

*5 Option CRTP reduces sensitivity by 0.6 dB (max) and increases noise by 15% (max).

*22 Smallest power level for mask test. Values represent theoretical typical sensitivity of NRZ eyes for comparison purposes. Assumes instrument peak-peak noise consumes most of the mask margin.

Optical Sampling Module Characteristics (Cont.)

Module

Extinction Ratio Calibrated Accuracy (Opt. 01 ER Calibrated)*23

Reference Filter

in Range [Gb/s]

Repeatability (Typical)

(to itself and to other 80Cxx-Opt. 01)

Accuracy

80C07B

Option not available

80C08C

9.9…11.3

±0.6% (–0.39 dB / +0.42 dB at 12 dB)

±1.2% (–0.76 dB / +0.92 dB at 12 dB)

80C10B

Option not available

80C11

9.9…11.3

±0.6% (–0.39 dB / +0.42 dB at 12 dB)

±1.2% (–0.76 dB / +0.92 dB at 12 dB)

80C25GBE

Option not available

*23 Low ER signals (ER ≤ 6 dB): signal passes 802.3ae-like mask (scaled horizontally for bit rate); 105 samples in mask. High ER signals (ER > 6 dB): signal passes OC-192-like mask (scaled horizontally for bit rate); 105 samples in mask.

TDR System (80E10, 80E08, 80E04 only)

Characteristic

80E10

80E08

80E04

Channels

2

2

2

Input Impedance

50 Ω nominal

50 Ω nominal

50 Ω nominal

Channel Input Connector

1.85 mm

2.92 mm

3.5 mm

Bandwidth

50 GHz

30 GHz

20 GHz

TDR Step Amplitude

250 mV (polarity of either step may be inverted)

250 mV (polarity of either step may be inverted)

250 mV (polarity of either step may be inverted)

TDR System Reflected Rise Time

15 ps

20 ps

28 ps

TDR System Incident Rise Time

12 ps

18 ps

23 ps 

TDR Step Deskew Range

±250 ps

±250 ps

±50 ps

TDR Sampler Deskew Range

±250 ps

±250 ps

+100 ns – 500 ps (slot deskew only)

TDR Step Maximum Repetition Rate

200 kHz

200 kHz

200 kHz

Physical Characteristics

Module

Dimensions (mm/in.)

Weight (kg/lb.)

Width

Height

Depth

Net

80C07B

165/6.5

25/1.0

305/12.0

<1.36/<3.0

80C08C

165/6.5

25/1.0

305/12.0

<1.22/<2.7

80C10B

165/6.5

25/1.0

305/12.0

<2.61/<5.75

80C11

165/6.5

25/1.0

305/12.0

<1.22/<2.7

80C12

165/6.5

25/1.0

305/12.0

<2.61/<5.75

80C14

165/6.5

25/1.0

305/12.0

<2.61/<5.75

80C25GBE

165/6.5

25/1.0

305/12.0

<2.61/<5.75

Electrical Sampling Module Characteristics

Module

Application Type

Channels

Input Impedance

Channel Input Connector

Bandwidth*24

80E10

True-differential TDR, S-parameters and fault isolation

2

50 ±1.0 Ω

1.85 mm female, precision adapter to 2.92 mm included with 50 Ω SMA termination

50/40/30 GHz*12, 25

80E09

High-frequency, low-noise signal acquisition and jitter characterization

2

50 ±1.0 Ω

1.85 mm female, precision adapter to 2.92 mm included with 50 Ω SMA termination

60/40/30 GHz*12, 25

80E08

True-differential TDR and S-parameters

2

50 ±1.0 Ω

2.92 mm female

30/20 GHz*12, 25

80E07

Optimal noise/performance trade-off for jitter characterization

2

50 ±1.0 Ω

2.92 mm female

30/20 GHz*12, 25

80E06

High-speed electrical device characterization

1

50 ±0.5 Ω

1.85 mm female, precision adapter to 2.92 mm included with 50 Ω SMA termination

70+ GHz

80E04

TDR impedance and crosstalk characterization

2

50 ±0.5 Ω

3.5 mm female

20 GHz*12

80E03

Device characterization

2

50 ±0.5 Ω

3.5 mm female

20 GHz*12

80E01

High-frequency, high maximum operating range signal acquisition

1

50 ±0.5 Ω

2.4 mm female, precision adapter to 2.92 mm included with 50 Ω SMA termination

50 GHz

*12 Calculated from .35 bandwidth rise time product.

*24 Values shown are warranted unless printed in an italic typeface which represents an unwarranted characteristic value that the instrument will typically perform to.

*25 User selectable.

Electrical Sampling Module Characteristics (Cont.)

Module

Rise Time

(10-90%)

Dynamic Range

Offset Range

Maximum Operating Voltage

Maximum Nondestruct Voltage, DC+ACp-p

Vertical Number of Digitized Bits

80E10

7 ps*12

1.0 Vp-p

±1.1 V

±1.1 V

2.0 V

14 bits full scale

80E09

5.8 ps*12

1.0 Vp-p

±1.1 V

±1.1 V

2.0 V

14 bits full scale

80E08

11.7 ps*12

1.0 Vp-p

±1.1 V

±1.1 V

2.0 V

14 bits full scale

80E07

11.7 ps*12

1.0 Vp-p

±1.1 V

±1.1 V

2.0 V

14 bits full scale

80E06

5.0 ps*26

1.0 Vp-p

±1.6 V

±1.6 V

2.0 V

14 bits full scale

80E04

≤17.5 ps

1.0 Vp-p

±1.6 V

±1.6 V

3.0 V

14 bits full scale

80E03

≤17.5 ps

1.0 Vp-p

±1.6 V

±1.6 V

3.0 V

14 bits full scale

80E01

11.7 ps*12

1.0 Vp-p

±1.6 V

±1.6 V

2.0 V

14 bits full scale

*12 Calculated from .35 bandwidth rise time product.

*26 Calculated from formula rise time = 0.35/(typical bandwidth).

Electrical Sampling Module Characteristics (Cont.)

Module

Vertical Sensitivity Range

DC Vertical Voltage Accuracy, Single Point, within ±2 °C of Compensated Temperature

Typical Step Response Aberrations

RMS Noise*11

80E10

10 mV to 1.0 V full scale

±[2 mV + 0.007 (Offset) + 0.02 (Vertical Value – Offset)]

±1% or less over the zone 10 ns to 20 ps before step transition; +6%, –10% or less for the first 400 ps following step transition; +0%, –4% or less over the zone 400 ps to 3 ns following step transition; +1%, –2% or less over the zone 3 ns to 100 ns following step transition; ±1% after 100 ns following step transition

50 GHz: 600 μV, ≤700 μV

40 GHz: 370 μV, ≤480 μV

30 GHz: 300 μV, ≤410 μV

80E09

10 mV to 1.0 V full scale

±[2 mV + 0.007 (Offset) + 0.02 (Vertical Value – Offset)]

±1% or less over the zone 10 ns to 20 ps before step transition; +6%, –10% or less for the first 400 ps following step transition; +0%, –4% or less over the zone 400 ps to 3 ns following step transition; +1%, –2% or less over the zone 3 ns to 100 ns following step transition; ±1% after 100 ns following step transition

60 GHz: 450 μV, ≤600 μV

40 GHz: 330 μV, ≤480 μV

30 GHz: 300 μV, ≤410 μV

80E08

10 mV to 1.0 V full scale

±[2 mV + 0.007 (Offset) + 0.02 (Vertical Value – Offset)]

±1% or less over the zone 10 ns to 20 ps before step transition; +6%, –10% or less for the first 400 ps following step transition; +0%, –4% or less over the zone 400 ps to 3 ns following step transition; +1%, –2% or less over the zone 3 ns to 100 ns following step transition; ±1% after 100 ns following step transition

30 GHz: 300 μV, ≤410 μV

20 GHz: 280 μV, ≤380 μV

80E07

10 mV to 1.0 V full scale

±[2 mV + 0.007 (Offset) + 0.02 (Vertical Value – Offset)]

±1% or less over the zone 10 ns to 20 ps before step transition; +6%, –10% or less for the first 400 ps following step transition; +0%, –4% or less over the zone 400 ps to 3 ns following step transition; +1%, –2% or less over the zone 3 ns to 100 ns following step transition; ±1% after 100 ns following step transition

30 GHz: 300 μV, ≤410 μV

20 GHz: 280 μV, ≤380 μV

80E06*26

10 mV to 1.0 V full scale

±[2 mV + 0.007 (Offset) + 0.02 (Vertical Value – Offset)]

±5% or less for first 300 ps following step transition

1.8 mV, ≤2.4 mV (maximum)

80E04

10 mV to 1.0 V full scale

±[2 mV + 0.007 (Offset) + 0.02 (Vertical Value – Offset)]

±3% or less over the zone 10 ns to 20 ps before step transition; +10%, –5% or less for the first 300 ps following step transition; ±3% or less over the zone 300 ps to 5 ns following step transition; ±1% or less over the zone 5 ns to 100 ns following step transition; 0.5% after 100 ns following step transition

600 µV, ≤1.2 mV (maximum)

80E03

10 mV to 1.0 V full scale

±[2 mV + 0.007 (Offset) + 0.02 (Vertical Value – Offset)]

±3% or less over the zone 10 ns to 20 ps before step transition; +10%, –5% or less for the first 300 ps following step transition; ±3% or less over the zone 300 ps to 5 ns following step transition; ±1% or less over the zone 5 ns to 100 ns following step transition; ±0.5% after 100 ns following step transition

600 µV, ≤1.2 mV (maximum)

80E01

10 mV to 1.0 V full scale

±[2 mV + 0.007 (Offset) + 0.02 (Vertical Value – Offset)]

±3% or less over the zone 10 ns to 20 ps before step transition; +12%, –5% or less for the first 300 ps following step transition; +5.5%, –3% or less over the zone 300 ps to 3 ns following step transition; ±1% or less over the zone 3 ns to 100 ns following step transition; ±0.5% after 100 ns following step transition

1.8 mV, ≤2.3 mV (maximum)

*11 Values shown are warranted unless printed in an italic typeface which represents a typical value.

*26 Calculated from formula rise time = 0.35/(typical bandwidth).

S-parameter Performance Characteristics (80E10)

Measurement Conditions

  • All measurements were performed after proper warm up as specified in the DSA8200 manual
  • Standard S-parameter dynamic range measurement practices were used to determine the dynamic range of the module
  • Uncertainty results were derived from a wide range of devices, with 250 averages
  • Better dynamic range can be achieved by selecting lower bandwidth settings on the 80E10 module due to lower RMS noise floor
  • Results apply to single-ended or differential measurements

Dynamic Range

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Uncertainty

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Physical Characteristics for Electrical Sampling Modules

Module

Dimensions (mm/in.)

Weight (kg/lb.)

   

Width

Height

Depth

Net

80E10*27

55/2.2

25/1.0

75/3.0

0.175/0.37

80E09*27

55/2.2

25/1.0

75/3.0

0.175/0.37

80E08*27

55/2.2

25/1.0

75/3.0

0.175/0.37

80E07*27

55/2.2

25/1.0

75/3.0

0.175/0.37

80E06

79/3.1

25/1.0

135/5.3

0.4/0.87

80E04

79/3.1

25/1.0

135/5.3

0.4/0.87

80E03

79/3.1

25/1.0

135/5.3

0.4/0.87

80E01

79/3.1

25/1.0

135/5.3

0.4/0.87

*27 Remote module characteristics.

80A05, CR125A, CR175A, and CR286A Electrical Clock Recovery

Product Feature

80A05

CR125A

CR175A

CR286A

Standard

Option 10G

Supported Specifications

Enumerated Standards

OC3/STM1

155.52 Mb/s

♦*28

♦*28

♦*28

OC12/STM4

622.08 Mb/s

Fibre Channel

1.063 Gb/s

Gigabit Ethernet

1.25 Gb/s

SAS Gen I

1.50 Gb/s

♦*29

♦*29

2 GB Fibre Channel

2.125 Gb/s

OC48/STM16

2.488 Gb/s

2 GB Ethernet

2.50 Gb/s

PCI Express I

2.50 Gb/s

♦*29

♦*29

Infiniband®

2.50 Gb/s

♦*28

♦*28

♦*28

2.5G G.709 FEC

2.666 Gb/s

♦*28

♦*28

♦*28

SAS Gen II

3.0 Gb/s

♦*29

♦*29

XAUI, 10GBase-X

3.125 Gb/s

♦*28

♦*28

♦*28

10GB Fibre Channel x4

3.188 Gb/s

♦*28

♦*28

♦*28

4 GB Fibre Channel

4.25 Gb/s

FB-DIMM1

3.2, 4.0, 4.8 Gb/s

 

♦*28, 29

PCI Express II

5.0 Gb/s

 

♦*28, 29

FB-DIMM2

4.8, 6.4, 8.0, 9.6 Gb/s

 

♦*28, 29

OIF CEI

6+ Gb/s

 

♦*28

2x XAUI

6.25 Gb/s

 

♦*28

♦*28

♦*28

8 GB Fibre Channel*9

8.50 Gb/s

 

 

OC192/STM64

9.953 Gb/s

 

XFP/XFI

9.95-11.2

 

♦*28

10GBase-W

9.953 Gb/s

 

♦*28

♦*28

♦*28

10GBase-R*9

10.31 Gb/s

 

10GB Fibre Channel

10.51 Gb/s

 

♦*28

♦*28

♦*28

G.975 FEC

10.66 Gb/s

 

♦*28

♦*28

♦*28

G.709 FEC

10.71 Gb/s

 

♦*28

♦*28

♦*28

OIF CEI

11+ Gb/s

 

♦*28

10 GbE w/ FEC

11.10 Gb/s

 

♦*28

♦*28

♦*28

Super FEC

12.50 Gb/s

 

♦*28

♦*28

♦*28

16GFC

14.025 Gb/s

 

 

♦*28

♦*28

♦*28

14G Infiniband FDR

14.063 Gb/s

 

 

 

♦*28

♦*28

100GbE-LR4/ER4

25.7 Gb/s

 

 

 

 

♦*28

100GbE-LR4/ER4 FEC

28.8 Gb/s

 

 

 

 

♦*28

Additional enumerated standard rates are supported with 8000 Series Firmware Releases higher than 2.4.x

Clock Recovery Ranges for Custom (User-specified) Rates (in addition to enumerated lists above)

50 Mb/s to 3.188 Gb/s

4.25 Gb/s

50 Mb/s to 3.188 Gb/s

3.267 to 4.25 Gb/s

4.900 to 6.375 Gb/s

9.800 to 12.60 Gb/s

150 Mb/s to 12.5 Gb/s continuous

150 Mb/s to 17.5 Gb/s continuous

150 Mb/s to 28.6 Gb/s continuous

Sensitivity (Clock recovery will lock, differential data is given for each input)

Lowest Supported Rate to 2.70 Gb/s

Differential ≤8 mVp-p

Single Ended 10 mVp-p

Differential 50 mV (typ)

Single Ended 100 mV (typ)

2.70 to 11.19 Gb/s

 

Differential ≤12 mVp-p

Single Ended 15 mVp-p

11.19 to 12.60 Gb/s

 

Differential ≤15 mVp-p

Single Ended 20 mVp-p

12.6 to 28.6 Gb/s

 

 

Differential 50 mV (typ)

Single Ended 100 mV (typ)

 

When equipped with Option HS:

Differential 20 mV (typ)

Single Ended 40 mV (typ)

*9 Draft version of the 8.5GFC filter. T11 committee redefined this filter at the April 2008 meeting. New 8.5GFC filter, as defined by T11 committee in April 2009, is identical to the 10GBase-R 10.313G filter and is available for 80C12 Option 10G modules and 80C14 modules; and is identified as 10Base-R.

*28 The standard is not enumerated but is supported as a custom rate.

*29 No spread spectrum clocking support.

DSA8200 Mainframe Physical Characteristics

Dimensions (mm/in.)

Weight (kg/lb.)

Width

Height

Depth

Net

457/18.0

343/13.5

419/16.5

21/46

Computer System and Peripherals

Characteristic

Description

Operating System

Windows XP

CPU

Intel Celeron 2.93 GHz processor

PC System Memory

1 GB

Hard Disk Drive

Rear-panel, removable hard disk drive, 40 GB capacity

DVD-ROM/CD-RW Drive

Front-panel DVD-ReadOnly/CD-ReadWrite drive with CD-creation software application

Input/Output Ports

Characteristic

Description

Front Panel

USB 2.0 Port

One USB 2.0 connector

Anti-static Connection

Banana-jack connector, 1 MΩ

Trigger Direct Input

See Trigger System specification

Trigger Pre-scale Input

See Trigger System specification

Internal Clock Output

See Trigger System specification

External 10 MHz Reference Input

±5 V maximum

DC Calibration Output

±1.25 V maximum

Rear Panel

USB Ports

4 USB 2.0 connectors

Parallel Port

IEEE 1284, DB-25 connector

LAN Port

RJ-45 connector, supports 10Base-T, 100Base-T

Serial Port

DB-9 COM1 port

GPIB

IEEE488.2 connector

VGA Video Port

DB-15 female connector; connect a second monitor to use dual-monitor display mode

Oscilloscope VGA Video Port

DB-15 female connector, connect to show the oscilloscope display, including live waveforms on an external monitor or projector

Gated Trigger Input

(Option GT only); See Trigger System specification

Operating Requirements

Characteristic

Description

Power Requirements

   Line voltage and frequency

100 to 240 V AC ±10% 50/60 Hz

115 V AC ±10% 400 Hz

Environmental Characteristics

   Temperature

      Operating

+10 °C to +40 °C

      Nonoperating

–22 °C to +60 °C

   Relative Humidity

      Operating

      (Floppy disk and CD-ROM not installed)

20% to 80% at or below 40 °C (upper limit de-rates to 45% relative humidity at 40 °C)

      Nonoperating

5% to 90% at or below 60 °C (upper limit de-rates to 20% relative humidity at +60 °C)

   Altitude

      Operating

3,048 m (10,000 ft.)

      Nonoperating

12,190 m (40,000 ft.)

Electromagnetic Compatibility

89/336/EEC

Safety

UL3111-1, CSA1010.1, EN61010-1, IEC61010-1

 

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