Ganz gleich, ob Ihr Prüfling ein Sender oder ein Empfänger ist: Tektronix gibt Ihnen branchenführende Werkzeuge für Verifizierung, Debugging und Konformitätsprüfungen an die Hand.

  • Unsere Lösungen bieten eine automatisierte, einfache und effiziente Möglichkeit, die SATA-IO-Anforderungen für Hosts und Geräte der Typen Gen1, Gen2 und Gen3 (6 Gbit/s) zu erfüllen.
  • Außerdem erhalten Sie ein umfassendes Paket an Verifizierungs- und Debugging-Werkzeugen, um die Serial Attached SCSI-Anforderungen für SAS-3- und SAS-4-Hosts und -Geräte zu erfüllen.

Entscheiden Sie sich jetzt für Werkzeuge für automatisierte TX- und-RX-Konformitätsprüfungen – von einem einzigen Anbieter und für SAS- und SATA-Schnittstellen der aktuellen und nächsten Generationen.

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Bibliothek

Title
Overcoming Receiver Test Challenges in Gen4 I/O Applications

This new application note provides vital information on performing compliance and diagnostic tests for Gen4 enterprise receivers with Bit Error Rate Testers.  

The Basics of Serial Data Compliance and Validation Measurements

This primer is designed to help you understand the common aspects of serial data transmission & to explain the analog and digital measurement requirements that apply to these emerging serial technologies

Understanding the Transition to Gen4 Enterprise & Datacenter I/O Standards

This whitepaper provides important information about adaptive equalization and link training, the impact of forward error correction (FEC) on compliance testing, debugging protocol handshaking and physical layer issues and new trends in channel performance evaluation along with other pertinent material when transitioning toGen4 standards.

Advanced Serdes Debug with a BERT

Learn simple strategies to pinpoint bit errors to the exact bit position and timing with powerful Error Location Analysis and a BERT.

High Speed Interface StandardsThis e-Guide will help you learn more about design challenges for testing PCIe 4.0, SAS, SuperSpeed USB, and DDR4 standards. Within the pages of the eGuide you will also get quick access to technical resources that will help you understand design challenges and pick the right solution for your test needs.
Analog Signals Join Digital Patterns In Serial Data

With fast digital-to-analog converters and faster sample clock capabilities, a new generation of AWGs is evolving as a way to generate waveforms for high-speed serial bus protocols such as SATA 2 and PCI-Express.

Measurement Solutions for Disk Drive Design

This application note illustrates a number of measurement techniques relevant to six general areas of disk drive design. It provides a summary of modern instrumentation and techniques available for probing, capturing, and analyzing electronic signals that are found in disk drive systems.

Automation Answers Compliance Challenge

Interoperability and compliance concerns are commanding an ever-larger share of the serial system designer's attention.

Title
Resolving SATA/SAS Test and Debug Challenges

SAS and SATA industry standards are driving growth in enterprise storage due to the emergence of SSD technology. New updates to the SAS4 standard drive new challenges and requirements in compliance and debug testing, including higher data rate, increasing channel loss, and forward error correction. This webinar will review the most recent SAS and SATA versions.

SAS and SATA Webinar

SAS and SATA industry standards are driving growth in enterprise storage due to the emergence of SSD technology. New updates to the SAS4 standard drive new challenges and requirements in compliance and debug testing, including higher data rate, increasing channel loss, and forward error correction. This webinar will review the most recent SAS and SATA versions.

Beyond Receiver Interoperability Testing Webinar

Beyond Receiver Interoperability Testing Webinar

High Speed Serial Data Receiver Testing Webinar

This tutorial discusses the challenges in generating signals with increasing speeds for the latest serial standards and that thoroughly test any receiver with real world or "worst case" conditions. You will also learn how Direct Synthesis techniques enable a much more simplified method for many serial data test requirements.

Title
SATA Tektronix MOI for RSG tests using Tektronix AWG7000

This MOI specifies the testing procedures for SATA RSG Tests using a Tektronix AWG7000.

SATA Tektronix Test Procedures for PHY, TSG and OOB Tests

This MOI specifies the testing procedures for SATA TSG, PHY and OOB Tests using a Tektronix DPO70000 Oscilloscope.

SATA BERTScope MOI for RSG Tests

This MOI specifies the testing procedures for SATA RSG Tests using a BERTScope.

SAS-2 6Gbps Physical Layer Test Procedures

This MOI specifies the testing procedures for the SAS6 Gb PHY Layer testing

Serial ATA MOI for Rx/Tx Tests with DSA8300 Series Sampling Scope

This MOI specifies the testing procedures for SATA Rx/Tx Tests using a DSA8300 Sampling Scope.

SAS3 MOI for Transmitter Testing
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